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Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992

2024-12-27T14:33:22Z

Author Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
Preferred Shelf Number ONLINE
Electronic Access ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
Format: Electronic Resources
Availability Online Library~1

Hot carriers in semiconductor nanostructures physics and applications

2024-12-27T14:33:22Z

Author Shah, J. (Jagdeep)
Preferred Shelf Number ONLINE
Electronic Access ScienceDirect http://www.sciencedirect.com/science/book/9780126381405
Format: Electronic Resources
Availability Online Library~1

Hydrogen in semiconductors bulk and surface properties : proceedings of the Sixth Trieste IUPAP-ICTP Semiconductor Symposium, International Centre for Theoretical Physics, Trieste, Italy, 27-31 August 1990

2024-12-27T14:33:22Z

Author Trieste ICTP-IUPAP Semiconductor Symposium (6th : 1990) Stutzmann, M. (Martin) Chevallier, J. (Jacques)
Preferred Shelf Number ONLINE
Electronic Access ScienceDirect http://www.sciencedirect.com/science/book/9780444891389
Format: Electronic Resources
Availability Online Library~1