Search Results for Kongress. - Narrowed by: 1993 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dKongress.$0026qf$003dPUBDATE$002509Publication$002bDate$0025091993$0025091993$0026ic$003dtrue$0026te$003dILS$0026ps$003d300? 2024-11-12T01:36:03Z Robotics, mechatronics and manufacturing systems transactions of the IMACS/SICE International Symposium on Robotics, Mechatronics, and Manufacturing Systems, Kobe, Japan, 16-20 September, 1992 ent://SD_ILS/0/SD_ILS:255242 2024-11-12T01:36:03Z 2024-11-12T01:36:03Z Author&#160;IMACS/SICE International Symposium on Robotics, Mechatronics, and Manufacturing Systems (1992 : K&#333;be-shi, Japan)&#160;Takamori, Toshi, 1940-&#160;Tsuchiya, Kazuo, 1943-&#160;International Association for Mathematics and Computers in Simulation.&#160;Keisoku Jid&#333; Seigyo Gakkai (Japan)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444897008">http://www.sciencedirect.com/science/book/9780444897008</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992 ent://SD_ILS/0/SD_ILS:256273 2024-11-12T01:36:03Z 2024-11-12T01:36:03Z Author&#160;Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France)&#160;Crean, G. M.&#160;Stuck, R.&#160;Woollam, John A.&#160;European Materials Research Society.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780444899088">http://www.sciencedirect.com/science/book/9780444899088</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>