Search Results for Logic circuits -- Testing. - Narrowed by: Electronic Library
SirsiDynix Enterprise
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Emerging Computing: From Devices to Systems Looking Beyond Moore and Von Neumann
ent://SD_ILS/0/SD_ILS:527384
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Author Aly, Mohamed M. Sabry. editor. Chattopadhyay, Anupam. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-16-7487-7">https://doi.org/10.1007/978-981-16-7487-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Formal Modeling and Analysis of Timed Systems 21st International Conference, FORMATS 2023, Antwerp, Belgium, September 19-21, 2023, Proceedings
ent://SD_ILS/0/SD_ILS:521082
2025-12-13T02:50:37Z
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Author Petrucci, Laure. editor. Sproston, Jeremy. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-42626-1">https://doi.org/10.1007/978-3-031-42626-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Logic testing and design for testability
ent://SD_ILS/0/SD_ILS:220153
2025-12-13T02:50:37Z
2025-12-13T02:50:37Z
Author Fujiwara, Hideo.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>