Search Results for Management -- Statistical methods. - Narrowed by: CRC Ebooks SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dManagement$002b--$002bStatistical$002bmethods.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253ACRCEBOOKS$002509CRC$002bEbooks$0026ps$003d300? 2026-01-20T09:42:30Z Risk and Reliability : Coastal and Hydraulic Engineering ent://SD_ILS/0/SD_ILS:541176 2026-01-20T09:42:30Z 2026-01-20T09:42:30Z Author&#160;Reeve, Dominic, author.<br/>Preferred Shelf Number&#160;TC205 .R448 2014<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781482266351">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Financial justification of nondestructive testing : cost of quality in manufacturing ent://SD_ILS/0/SD_ILS:542923 2026-01-20T09:42:30Z 2026-01-20T09:42:30Z Author&#160;Papadakis, Emmanuel P., author.<br/>Preferred Shelf Number&#160;TA417.2 .P37 2007<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781420009705">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Quality assurance for the food industry : a practical approach ent://SD_ILS/0/SD_ILS:543280 2026-01-20T09:42:30Z 2026-01-20T09:42:30Z Author&#160;Vasconcellos, J. Andres, author.<br/>Preferred Shelf Number&#160;TP372.5 .V37 2004<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9780203498101">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Environmental monitoring ent://SD_ILS/0/SD_ILS:547260 2026-01-20T09:42:30Z 2026-01-20T09:42:30Z Author&#160;Wiersma, G. B.<br/>Preferred Shelf Number&#160;QH541.15 .M64 E584 2004<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135462581">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/> Key Topics in Clinical Research. ent://SD_ILS/0/SD_ILS:537771 2026-01-20T09:42:30Z 2026-01-20T09:42:30Z Author&#160;Gao Smith, F.&#160;Smith, J. E.<br/>Preferred Shelf Number&#160;RA407 .S64 2003<br/>Electronic Access&#160;Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429205897">https://www.taylorfrancis.com/books/9780429205897</a> OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Handbook of silicon semiconductor metrology ent://SD_ILS/0/SD_ILS:547244 2026-01-20T09:42:30Z 2026-01-20T09:42:30Z Author&#160;Diebold, A. C. (Alain C.)<br/>Preferred Shelf Number&#160;TK7871.85 .H3337 2001<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9781135554842">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/>