Search Results for Management -- Statistical methods. - Narrowed by: CRC EbooksSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dManagement$002b--$002bStatistical$002bmethods.$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253ACRCEBOOKS$002509CRC$002bEbooks$0026ps$003d300?2026-01-20T09:42:30ZRisk and Reliability : Coastal and Hydraulic Engineeringent://SD_ILS/0/SD_ILS:5411762026-01-20T09:42:30Z2026-01-20T09:42:30ZAuthor Reeve, Dominic, author.<br/>Preferred Shelf Number TC205 .R448 2014<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781482266351">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Financial justification of nondestructive testing : cost of quality in manufacturingent://SD_ILS/0/SD_ILS:5429232026-01-20T09:42:30Z2026-01-20T09:42:30ZAuthor Papadakis, Emmanuel P., author.<br/>Preferred Shelf Number TA417.2 .P37 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420009705">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Quality assurance for the food industry : a practical approachent://SD_ILS/0/SD_ILS:5432802026-01-20T09:42:30Z2026-01-20T09:42:30ZAuthor Vasconcellos, J. Andres, author.<br/>Preferred Shelf Number TP372.5 .V37 2004<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9780203498101">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Environmental monitoringent://SD_ILS/0/SD_ILS:5472602026-01-20T09:42:30Z2026-01-20T09:42:30ZAuthor Wiersma, G. B.<br/>Preferred Shelf Number QH541.15 .M64 E584 2004<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135462581">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Key Topics in Clinical Research.ent://SD_ILS/0/SD_ILS:5377712026-01-20T09:42:30Z2026-01-20T09:42:30ZAuthor Gao Smith, F. Smith, J. E.<br/>Preferred Shelf Number RA407 .S64 2003<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780429205897">https://www.taylorfrancis.com/books/9780429205897</a>
OCLC metadata license agreement <a href="http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf">http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of silicon semiconductor metrologyent://SD_ILS/0/SD_ILS:5472442026-01-20T09:42:30Z2026-01-20T09:42:30ZAuthor Diebold, A. C. (Alain C.)<br/>Preferred Shelf Number TK7871.85 .H3337 2001<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135554842">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>