Search Results for Materials -- Microscopy. - Narrowed by: Surfaces (Physics).SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMaterials$002b--$002bMicroscopy.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026ps$003d300?dt=list2024-12-24T05:38:07ZTransmission Electron Microscopy and Diffractometry of Materialsent://SD_ILS/0/SD_ILS:3332652024-12-24T05:38:07Z2024-12-24T05:38:07ZAuthor Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333265.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-29761-8">http://dx.doi.org/10.1007/978-3-642-29761-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transmission Electron Microscopy and Diffractometry of Materialsent://SD_ILS/0/SD_ILS:1869972024-12-24T05:38:07Z2024-12-24T05:38:07ZAuthor Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopyent://SD_ILS/0/SD_ILS:1727912024-12-24T05:38:07Z2024-12-24T05:38:07ZAuthor Kalinin, Sergei V. editor. Gruverman, Alexei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-7167-8">http://dx.doi.org/10.1007/978-1-4419-7167-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transmission Electron Microscopy A Textbook for Materials Scienceent://SD_ILS/0/SD_ILS:1673512024-12-24T05:38:07Z2024-12-24T05:38:07ZAuthor Williams, David B. author. Carter, C. Barry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-76501-3">http://dx.doi.org/10.1007/978-0-387-76501-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002ent://SD_ILS/0/SD_ILS:1687902024-12-24T05:38:07Z2024-12-24T05:38:07ZAuthor Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/1-4020-3019-3">http://dx.doi.org/10.1007/1-4020-3019-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>