Search Results for Materials -- Microscopy. - Narrowed by: Weights and measures.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMaterials$002b--$002bMicroscopy.$0026qf$003dSUBJECT$002509Subject$002509Weights$002band$002bmeasures.$002509Weights$002band$002bmeasures.$0026ps$003d300?dt=list2024-12-19T18:16:28ZMicroscopy of Semiconducting Materials 2007ent://SD_ILS/0/SD_ILS:1702472024-12-19T18:16:28Z2024-12-19T18:16:28ZAuthor Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4020-8615-1">http://dx.doi.org/10.1007/978-1-4020-8615-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UKent://SD_ILS/0/SD_ILS:1829952024-12-19T18:16:28Z2024-12-19T18:16:28ZAuthor Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/3-540-31915-8">http://dx.doi.org/10.1007/3-540-31915-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>