Search Results for Materials -- Microscopy.

Microscopy of Semiconducting Materials 2007

2024-12-19T17:09:04Z

Author Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-1-4020-8615-1
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Transmission Electron Microscopy and Diffractometry of Materials

2024-12-19T17:09:04Z

Author Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)
Preferred Shelf Number ONLINE(333265.1)
Electronic Access http://dx.doi.org/10.1007/978-3-642-29761-8
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Transmission Electron Microscopy and Diffractometry of Materials

2024-12-19T17:09:04Z

Author Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-3-540-73886-2
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Electron microscopy and structure of materials : proceedings

2024-12-19T17:09:04Z

Author International Materials Symposium (5th : 1971 : University of California, Berkeley) Thomas, Gareth. , ed. Fulrath, Richard M. , ed. Fisher, Robert M., ed. University Conference on Ceramic Science (7th : 1971 : Berkeley)
Preferred Shelf Number TA 407 I65 1972
Format: Books
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Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy

2024-12-19T17:09:04Z

Author Kalinin, Sergei V. editor. Gruverman, Alexei. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-1-4419-7167-8
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Transmission Electron Microscopy A Textbook for Materials Science

2024-12-19T17:09:04Z

Author Williams, David B. author. Carter, C. Barry. author. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-0-387-76501-3
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EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science

2024-12-19T17:09:04Z

Author Richter, Silvia. editor. Schwedt, Alexander. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-3-540-85226-1
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Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002

2024-12-19T17:09:04Z

Author Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/1-4020-3019-3
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Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK

2024-12-19T17:09:04Z

Author Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/3-540-31915-8
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Characterization of High Tc Materials and Devices by Electron Microscopy

2024-12-19T17:09:04Z

Author Browning, Nigel D.. Pennycook, Stephen J..
Preferred Shelf Number ONLINE
Electronic Access Access by subscription
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Handbook of microscopy applications in materials science, solid-state physics, and chemistry

2024-12-19T17:09:04Z

Author Amelinckx, S. (Severin) Wiley InterScience (Online service)
Preferred Shelf Number ONLINE
Electronic Access John Wiley http://dx.doi.org/10.1002/9783527619283
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Handbook of microscopy applications in materials science, solid-state physics, and chemistry

2024-12-19T17:09:04Z

Author Amelinckx, S. (Severin) Wiley InterScience (Online service)
Preferred Shelf Number ONLINE
Electronic Access Wiley InterScience An electronic book accessible through the World Wide Web; click for information
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Handbook of microscopy applications in materials science, solid-state physics and chemistry. Methods I

2024-12-19T17:09:04Z

Handbook of microscopy applications in materials science, solid-state physics and chemistry. Applications

2024-12-19T17:09:04Z

Electron microscopy in plasticity and fracture research of materials : proceedings of the international symposium held at Holzhau near Dresden, 8 to 13 October 1989

2024-12-19T17:09:04Z

Author Messerschmidt, U. , ed.
Preferred Shelf Number TA 417.35 E43 1990
Format: Books
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Scanning electron microscopy : applications to materials and device science

2024-12-19T17:09:04Z

Author Thornton, P. R.
Preferred Shelf Number QH 212.E4 T52 1968 1.K
Format: Books
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Electron microscopy in heterogeneous catalysis

2024-12-19T17:09:04Z

Author Gai, Pratibha L., 1948- Boyes, E. D. (Edward D.)
Preferred Shelf Number ONLINE
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Characterization of radiation-damage by transmission electron microscopy

2024-12-19T17:09:04Z

Author Jenkins, M. L., 1949- Kirk, M. A., 1942-
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Atlas of Functional Anatomy for Regional Anesthesia and Pain Medicine Human Structure, Ultrastructure and 3D Reconstruction Images

2024-12-19T17:09:04Z

Author Reina, Miguel Angel. editor. De Andrés, José Antonio. editor. Hadzic, Admir. editor. Prats-Galino, Alberto. editor. Sala-Blanch, Xavier. editor.
Preferred Shelf Number XX(520074.1)
Electronic Access https://doi.org/10.1007/978-3-319-09522-6
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Fundamentals and applications of ultrasonic waves

2024-12-19T17:09:04Z

Author Cheeke, J. David N.
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Aberration-corrected analytical transmission electron microscopy

2024-12-19T17:09:04Z

Author Brydson, Rik, editor, author.
Preferred Shelf Number ONLINE(318971.1)
Electronic Access Connect to MyiLibrary resource. Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=693217 ebrary http://site.ebrary.com/id/10488537 EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=509882 John Wiley http://dx.doi.org/10.1002/9781119978848
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Handbook of surface and interface analysis methods for problem-solving

2024-12-19T17:09:04Z

Author Rivir̈e, J. C. Myhra, S. (Sverre), 1943-
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Nanoscience Nanobiotechnology and Nanobiology

2024-12-19T17:09:04Z

Author Boisseau, Patrick. editor. Houdy, Philippe. editor. Lahmani, Marcel. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-3-540-88633-4
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Microstructural characterization of materials

2024-12-19T17:09:04Z

Author Brandon, D. G. Kaplan, Wayne D. Wiley InterScience (Online service)
Preferred Shelf Number ONLINE
Electronic Access Online text http://onlinelibrary.wiley.com/book/10.1002/9780470727133 Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=470287 John Wiley http://dx.doi.org/10.1002/9780470727133 MyiLibrary, Table of contents http://www.myilibrary.com?id=234294&ref=toc
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Carbon nanotubes properties and applications

2024-12-19T17:09:04Z

Author O'Connell, Michael (Michael J.)
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Mechanical tribology materials, characterization, and applications

2024-12-19T17:09:04Z

Author Totten, George E. Liang, Hong.
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Transmission electron energy loss spectrometry in materials science and the EELS atlas

2024-12-19T17:09:04Z

Author Ahn, C. C. (Channing C.) John Wiley & Sons.
Preferred Shelf Number ONLINE
Electronic Access John Wiley http://dx.doi.org/10.1002/3527605495
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Nano and microstructural design of advanced materials a commemorative volume on Professor G. Thomas' seventieth birthday

2024-12-19T17:09:04Z

Author Thomas, Gareth, 1932- Meyers, Marc A. Ritchie, R. O. (Robert O.) Sarikaya, Mehmet.
Preferred Shelf Number ONLINE
Electronic Access ScienceDirect http://www.sciencedirect.com/science/book/9780080443737
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Industrial applications of electron microscopy

2024-12-19T17:09:04Z

Author Li, Zhigang R., 1958-
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