Search Results for Mathematical statistics - Narrowed by: 1990 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMathematical$002bstatistics$0026qf$003dPUBDATE$002509Publication$002bDate$0025091990$0025091990$0026ic$003dtrue$0026ps$003d300?dt=list 2024-11-28T13:26:15Z Selected tables in mathematical statistics ent://SD_ILS/0/SD_ILS:72868 2024-11-28T13:26:15Z 2024-11-28T13:26:15Z Author&#160;Harter, Harman Leon, 1919- comp.&#160;Owen, Donald B.<br/>Preferred Shelf Number&#160;QA 276.25 H37 1970- V.1<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Lisp-Stat an object-oriented environment for statistical computing and dynamic graphics ent://SD_ILS/0/SD_ILS:295261 2024-11-28T13:26:15Z 2024-11-28T13:26:15Z Author&#160;Tierney, Luke.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469968">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469968</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316818">http://dx.doi.org/10.1002/9780470316818</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> A history of probability and statistics and their applications before 1750 ent://SD_ILS/0/SD_ILS:300245 2024-11-28T13:26:15Z 2024-11-28T13:26:15Z Author&#160;Hald, Anders, 1913-&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/0471725161">http://dx.doi.org/10.1002/0471725161</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust estimation and testing ent://SD_ILS/0/SD_ILS:300353 2024-11-28T13:26:15Z 2024-11-28T13:26:15Z Author&#160;Staudte, Robert G.&#160;Sheather, Simon J.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118165485">An electronic book accessible through the World Wide Web; click for information</a> Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=818924">Click here to view book</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Accelerated testing statistical models, test plans and data analyses ent://SD_ILS/0/SD_ILS:295259 2024-11-28T13:26:15Z 2024-11-28T13:26:15Z Author&#160;Nelson, Wayne, 1936-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469757</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316795">http://dx.doi.org/10.1002/9780470316795</a> Contributor biographical information <a href="http://catdir.loc.gov/catdir/bios/wiley047/89024853.html">http://catdir.loc.gov/catdir/bios/wiley047/89024853.html</a> HathiTrust Digital Library Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/20454343.html">http://catalog.hathitrust.org/api/volumes/oclc/20454343.html</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Finding groups in data an introduction to cluster analysis ent://SD_ILS/0/SD_ILS:295260 2024-11-28T13:26:15Z 2024-11-28T13:26:15Z Author&#160;Kaufman, Leonard.&#160;Rousseeuw, Peter J.&#160;Wiley InterScience (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;John Wiley <a href="http://dx.doi.org/10.1002/9780470316801">http://dx.doi.org/10.1002/9780470316801</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Statistical methods in engineering and quality assurance ent://SD_ILS/0/SD_ILS:295262 2024-11-28T13:26:15Z 2024-11-28T13:26:15Z Author&#160;John, Peter William Meredith.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/21329921.html">http://catalog.hathitrust.org/api/volumes/oclc/21329921.html</a> John Wiley <a href="http://dx.doi.org/10.1002/9780470316825">http://dx.doi.org/10.1002/9780470316825</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Robust estimation and testing ent://SD_ILS/0/SD_ILS:76992 2024-11-28T13:26:15Z 2024-11-28T13:26:15Z Author&#160;Staudte, Robert G.&#160;Sheather, Simon J., ort. yaz.<br/>Preferred Shelf Number&#160;QA 276.8 S74 1990<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Introduction to statistical pattern recognition ent://SD_ILS/0/SD_ILS:268708 2024-11-28T13:26:15Z 2024-11-28T13:26:15Z Author&#160;Fukunaga, Keinosuke.<br/>Preferred Shelf Number&#160;Q327 F85 1990<br/>Format:&#160;Books<br/>Availability&#160;Beytepe Library~1<br/> Introduction to statistical pattern recognition ent://SD_ILS/0/SD_ILS:276343 2024-11-28T13:26:15Z 2024-11-28T13:26:15Z Author&#160;Fukunaga, Keinosuke.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080478654">http://www.sciencedirect.com/science/book/9780080478654</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>