Search Results for Mayer, James W.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMayer$00252C$002bJames$002bW.$0026ps$003d300?2024-09-13T01:34:31ZIon beam handbook for material analysisent://SD_ILS/0/SD_ILS:2561592024-09-13T01:34:31Z2024-09-13T01:34:31ZAuthor Mayer, James W., 1930- Rimini, E.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124808607">http://www.sciencedirect.com/science/book/9780124808607</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Ion implantation in semiconductors, silicon and germaniument://SD_ILS/0/SD_ILS:2550082024-09-13T01:34:31Z2024-09-13T01:34:31ZAuthor Mayer, James W., 1930- Eriksson, Lennart, 1938- author. Davies, John Arthur, 1927- author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780124808508">http://www.sciencedirect.com/science/book/9780124808508</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Ion implantation in semiconductors, silicon and germaniument://SD_ILS/0/SD_ILS:709272024-09-13T01:34:31Z2024-09-13T01:34:31ZAuthor Mayer, James W., 1930- Eriksson, Lennart, ort. yaz. Davies, John A., ort. yaz.<br/>Preferred Shelf Number TK 7871.85 M38 1970<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Laser annealing of semiconductorsent://SD_ILS/0/SD_ILS:2560602024-09-13T01:34:31Z2024-09-13T01:34:31ZAuthor Poate, J. M. Mayer, James W., 1930-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780125588201">http://www.sciencedirect.com/science/book/9780125588201</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Patterns of Light Chasing the Spectrum from Aristotle to LEDsent://SD_ILS/0/SD_ILS:1672322024-09-13T01:34:31Z2024-09-13T01:34:31ZAuthor Beeson, Steven. author. Mayer, James W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-75107-8">http://dx.doi.org/10.1007/978-0-387-75107-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Ion Implantation and Synthesis of Materialsent://SD_ILS/0/SD_ILS:1848312024-09-13T01:34:31Z2024-09-13T01:34:31ZAuthor Nastasi, Michael. author. Mayer, James W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-45298-0">http://dx.doi.org/10.1007/978-3-540-45298-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Ion beam analysis : fundamentals and applicationsent://SD_ILS/0/SD_ILS:3569702024-09-13T01:34:31Z2024-09-13T01:34:31ZAuthor Nastasi, Michael Anthony, 1950- author. Mayer, James W., 1930- author. Wang, Yongqiang (Nuclear physicist), author.<br/>Preferred Shelf Number ONLINE(356970.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439846391">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Silver Metallization Stability and Reliabilityent://SD_ILS/0/SD_ILS:1756772024-09-13T01:34:31Z2024-09-13T01:34:31ZAuthor Adams, Daniel. author. Alford, Terry L. author. Mayer, James W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-027-8">http://dx.doi.org/10.1007/978-1-84800-027-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals of Nanoscale Film Analysisent://SD_ILS/0/SD_ILS:1656232024-09-13T01:34:31Z2024-09-13T01:34:31ZAuthor Alford, Terry L. author. Feldman, Leonard C. author. Mayer, James W. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-29261-8">http://dx.doi.org/10.1007/978-0-387-29261-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Materials analysis by ion channeling submicron crystallographyent://SD_ILS/0/SD_ILS:2560752024-09-13T01:34:31Z2024-09-13T01:34:31ZAuthor Feldman, Leonard C. Mayer, James W., 1930- Picraux, S. T., 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122526800">http://www.sciencedirect.com/science/book/9780122526800</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Backscattering spectrometryent://SD_ILS/0/SD_ILS:2577832024-09-13T01:34:31Z2024-09-13T01:34:31ZAuthor Chu, Wei-Kan. Mayer, James W., 1930- joint author. Nicolet, Marc-A., joint author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780121738501">http://www.sciencedirect.com/science/book/9780121738501</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>