Search Results for McCall, James L., ed. - Narrowed by: EnglishSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMcCall$00252C$002bJames$002bL.$00252C$002bed.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026ic$003dtrue$0026ps$003d300?dt=list2024-12-18T19:13:16ZMetallographic specimen preparation : optical and electron microscopyent://SD_ILS/0/SD_ILS:177342024-12-18T19:13:16Z2024-12-18T19:13:16ZAuthor McCall, James L., ed. Mueller William M., ed.<br/>Preferred Shelf Number TN 690.7 M47 1974<br/>Format: Books<br/>Availability Beytepe Library~2<br/>Microstructural analysis tools and techniquesent://SD_ILS/0/SD_ILS:612662024-12-18T19:13:16Z2024-12-18T19:13:16ZAuthor McCall, James L., ed. Mueller, William, M., ed.<br/>Preferred Shelf Number TN 689.2 M53 1973<br/>Format: Books<br/>Availability Beytepe Library~1<br/>