Search Results for Measurement . - Narrowed by: Wiley InterScience (Online service) - Electronic Library - Electronic books.
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Measurement errors in surveys
ent://SD_ILS/0/SD_ILS:300333
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Author Biemer, Paul P. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9781118150382">An electronic book accessible through the World Wide Web; click for information</a>
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Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
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Author International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611371">http://dx.doi.org/10.1002/9780470611371</a>
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HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/230183422.html">http://catalog.hathitrust.org/api/volumes/oclc/230183422.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Power quality indices in liberalized markets
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Author Caramia, Pierluigi. Carpinelli, Guido. Verde, Paola, 1966- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=470181">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=470181</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470994405">http://dx.doi.org/10.1002/9780470994405</a>
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PH-Messung der Leitfaden für Praktiker
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Author Degner, Ralf. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527626076">http://dx.doi.org/10.1002/9783527626076</a>
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Nanoscale calibration standards and methods dimensional and related measurements in the micro- and nanometer range
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Author Wilkening, Günter. Koenders, Ludger. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0653/2006482032-b.html">http://catdir.loc.gov/catdir/enhancements/fy0653/2006482032-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/3527606661">http://dx.doi.org/10.1002/3527606661</a>
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