Search Results for Measurement&nbsp;&nbsp;&nbsp;. - Narrowed by: E-Book - 2008 - Computer science. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMeasurement$0025C2$0025A0$0025C2$0025A0$0025C2$0025A0.$0026qf$003dITYPE$002509Material$002bType$0025091$00253AE-KITAP$002509E-Book$0026qf$003dPUBDATE$002509Publication$002bDate$0025092008$0025092008$0026qf$003dSUBJECT$002509Subject$002509Computer$002bscience.$002509Computer$002bscience.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-09-11T00:35:58Z Software Process and Product Measurement International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers ent://SD_ILS/0/SD_ILS:188722 2024-09-11T00:35:58Z 2024-09-11T00:35:58Z Author&#160;Cuadrado-Gallego, Juan J. editor.&#160;Braungarten, Ren&eacute;. editor.&#160;Dumke, Reiner R. editor.&#160;Abran, Alain. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85553-8">http://dx.doi.org/10.1007/978-3-540-85553-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Passive and Active Network Measurement 9th International Conference, PAM 2008, Cleveland, OH, USA, April 29-30, 2008. Proceedings ent://SD_ILS/0/SD_ILS:188369 2024-09-11T00:35:58Z 2024-09-11T00:35:58Z Author&#160;Claypool, Mark. editor.&#160;Uhlig, Steve. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-79232-1">http://dx.doi.org/10.1007/978-3-540-79232-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The IT Measurement Compendium Estimating and Benchmarking Success with Functional Size Measurement ent://SD_ILS/0/SD_ILS:185392 2024-09-11T00:35:58Z 2024-09-11T00:35:58Z Author&#160;Bundschuh, Manfred. author.&#160;Dekkers, Carol. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-68188-5">http://dx.doi.org/10.1007/978-3-540-68188-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings ent://SD_ILS/0/SD_ILS:189262 2024-09-11T00:35:58Z 2024-09-11T00:35:58Z Author&#160;Dumke, Reiner R. editor.&#160;Braungarten, Ren&eacute;. editor.&#160;B&uuml;ren, G&uuml;nter. editor.&#160;Abran, Alain. editor.&#160;Cuadrado-Gallego, Juan J. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-89403-2">http://dx.doi.org/10.1007/978-3-540-89403-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>