Search Results for Measurement&nbsp;&nbsp;&nbsp;. - Narrowed by: English - 2012 - Nanotechnology. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMeasurement$0025C2$0025A0$0025C2$0025A0$0025C2$0025A0.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dPUBDATE$002509Publication$002bDate$0025092012$0025092012$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue? 2024-10-25T11:11:58Z Micro- and nanoscale phenomena in tribology ent://SD_ILS/0/SD_ILS:290773 2024-10-25T11:11:58Z 2024-10-25T11:11:58Z Author&#160;Chung, Yip-wah, 1950-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439839232">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Atomic nanoscale technology in the nuclear industry ent://SD_ILS/0/SD_ILS:289894 2024-10-25T11:11:58Z 2024-10-25T11:11:58Z Author&#160;Woo, Taeho.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439881590">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>