Search Results for Measurement . - Narrowed by: English - 2012 - Nanotechnology.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMeasurement$0025C2$0025A0$0025C2$0025A0$0025C2$0025A0.$0026qf$003dLANGUAGE$002509Language$002509ENG$002509English$0026qf$003dPUBDATE$002509Publication$002bDate$0025092012$0025092012$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?2024-10-25T11:11:58ZMicro- and nanoscale phenomena in tribologyent://SD_ILS/0/SD_ILS:2907732024-10-25T11:11:58Z2024-10-25T11:11:58ZAuthor Chung, Yip-wah, 1950-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439839232">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Atomic nanoscale technology in the nuclear industryent://SD_ILS/0/SD_ILS:2898942024-10-25T11:11:58Z2024-10-25T11:11:58ZAuthor Woo, Taeho.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439881590">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>