Search Results for Measurement . - Narrowed by: Nanotechnology.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMeasurement$0025C2$0025A0$0025C2$0025A0$0025C2$0025A0.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026ic$003dtrue$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?
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Nanotechnology and Nanoelectronics Materials, Devices, Measurement Techniques
ent://SD_ILS/0/SD_ILS:180848
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Author Fahrner, W. R. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b137771">http://dx.doi.org/10.1007/b137771</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nanotribology and Nanomechanics I Measurement Techniques and Nanomechanics
ent://SD_ILS/0/SD_ILS:192920
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Author Bhushan, Bharat. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-15283-2">http://dx.doi.org/10.1007/978-3-642-15283-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical Measurement Techniques Innovations for Industry and the Life Sciences
ent://SD_ILS/0/SD_ILS:186402
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Author Peiponen, Kai-Erik. editor. Myllylä, Risto. editor. Priezzhev, Alexander V. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-71927-4">http://dx.doi.org/10.1007/978-3-540-71927-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Metrology
ent://SD_ILS/0/SD_ILS:485379
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Author Gao, Wei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-4938-5">https://doi.org/10.1007/978-981-10-4938-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Ellipsometry at the Nanoscale
ent://SD_ILS/0/SD_ILS:333782
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Author Losurdo, Maria. editor. Hingerl, Kurt. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333782.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33956-1">http://dx.doi.org/10.1007/978-3-642-33956-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Surface Science Techniques
ent://SD_ILS/0/SD_ILS:333819
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Author Bracco, Gianangelo. editor. Holst, Bodil. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333819.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-34243-1">http://dx.doi.org/10.1007/978-3-642-34243-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Micro- and nanoscale phenomena in tribology
ent://SD_ILS/0/SD_ILS:290773
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Author Chung, Yip-wah, 1950-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439839232">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Atomic nanoscale technology in the nuclear industry
ent://SD_ILS/0/SD_ILS:289894
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Author Woo, Taeho.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439881590">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>