Search Results for Measurement&nbsp;&nbsp;&nbsp;. - Narrowed by: Software engineering. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMeasurement$0025C2$0025A0$0025C2$0025A0$0025C2$0025A0.$0026qf$003dSUBJECT$002509Subject$002509Software$002bengineering.$002509Software$002bengineering.$0026te$003dILS$0026ps$003d300? 2024-09-03T03:53:12Z Software Measurement Establish &mdash; Extract &mdash; Evaluate &mdash; Execute ent://SD_ILS/0/SD_ILS:186335 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Ebert, Christof. author.&#160;Dumke, Reiner. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-71649-5">http://dx.doi.org/10.1007/978-3-540-71649-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software measurement and estimation a practical approach ent://SD_ILS/0/SD_ILS:249472 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Laird, Linda M., 1952-&#160;Brennan, M. Carol, 1954-&#160;IEEE Computer Society.&#160;John Wiley &amp; Sons.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software Development Measurement Programs Development, Management and Evolution ent://SD_ILS/0/SD_ILS:402744 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Staron, Miroslaw. author.&#160;Meding, Wilhelm. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-91836-5">https://doi.org/10.1007/978-3-319-91836-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Measurement, Modelling and Evaluation of Computing Systems 19th International GI/ITG Conference, MMB 2018, Erlangen, Germany, February 26-28, 2018, Proceedings ent://SD_ILS/0/SD_ILS:400812 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;German, Reinhard. editor.&#160;Hielscher, Kai-Steffen. editor.&#160;Krieger, Udo R. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-74947-1">https://doi.org/10.1007/978-3-319-74947-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Aligning Organizations Through Measurement The GQM+Strategies Approach ent://SD_ILS/0/SD_ILS:485471 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Basili, Victor. author.&#160;Trendowicz, Adam. author.&#160;Kowalczyk, Martin. author.&#160;Heidrich, Jens. author.&#160;Seaman, Carolyn. author.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-05047-8">https://doi.org/10.1007/978-3-319-05047-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Measurement, Modeling and Evaluation of Computing Systems and Dependability and Fault Tolerance 17th International GI/ITG Conference, MMB &amp; DFT 2014, Bamberg, Germany, March 17-19, 2014, Proceedings ent://SD_ILS/0/SD_ILS:487540 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Fischbach, Kai. editor.&#160;Krieger, Udo R. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-05359-2">https://doi.org/10.1007/978-3-319-05359-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Measurement Methodology and Tools First European Workshop, FP7 FIRE/EULER Project, Aalborg, Denmark, May 9, 2012, Revised and Extended Papers ent://SD_ILS/0/SD_ILS:335086 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;F&agrave;brega, Llu&iacute;s. editor.&#160;Vil&agrave;, Pere. editor.&#160;Careglio, Davide. editor.&#160;Papadimitriou, Dimitri. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(335086.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-41296-7">http://dx.doi.org/10.1007/978-3-642-41296-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Passive and Active Measurement 13th International Conference, PAM 2012, Vienna, Austria, March 12-14th, 2012. Proceedings ent://SD_ILS/0/SD_ILS:196471 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Taft, Nina. editor.&#160;Ricciato, Fabio. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-28537-0">http://dx.doi.org/10.1007/978-3-642-28537-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Measurement, Modelling, and Evaluation of Computing Systems and Dependability and Fault Tolerance 16th International GI/ITG Conference, MMB &amp; DFT 2012, Kaiserslautern, Germany, March 19-21, 2012. Proceedings ent://SD_ILS/0/SD_ILS:196472 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Schmitt, Jens B. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-28540-0">http://dx.doi.org/10.1007/978-3-642-28540-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Topics in Performance Evaluation, Measurement and Characterization Third TPC Technology Conference, TPCTC 2011, Seattle, WA, USA, August 29-September 3, 2011, Revised Selected Papers ent://SD_ILS/0/SD_ILS:197247 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Nambiar, Raghunath. editor.&#160;Poess, Meikel. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-32627-1">http://dx.doi.org/10.1007/978-3-642-32627-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Performance Evaluation, Measurement and Characterization of Complex Systems Second TPC Technology Conference, TPCTC 2010, Singapore, September 13-17, 2010. Revised Selected Papers ent://SD_ILS/0/SD_ILS:193830 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Nambiar, Raghunath. editor.&#160;Poess, Meikel. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-18206-8">http://dx.doi.org/10.1007/978-3-642-18206-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Passive and Active Measurement 12th International Conference, PAM 2011, Atlanta, GA, USA, March 20-22, 2011. Proceedings ent://SD_ILS/0/SD_ILS:193986 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Spring, Neil. editor.&#160;Riley, George F. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-19260-9">http://dx.doi.org/10.1007/978-3-642-19260-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Measurement, Modelling, and Evaluation of Computing Systems and Dependability and Fault Tolerance 15th International GI/ITG Conference, MMB&amp;DFT 2010, Essen, Germany, March 15-17, 2010. Proceedings ent://SD_ILS/0/SD_ILS:191889 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;M&uuml;ller-Clostermann, Bruno. editor.&#160;Echtle, Klaus. editor.&#160;Rathgeb, Erwin P. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-12104-3">http://dx.doi.org/10.1007/978-3-642-12104-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Passive and Active Measurement 11th International Conference, PAM 2010, Zurich, Switzerland, April 7-9, 2010. Proceedings ent://SD_ILS/0/SD_ILS:191961 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Krishnamurthy, Arvind. editor.&#160;Plattner, Bernhard. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-12334-4">http://dx.doi.org/10.1007/978-3-642-12334-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software Process and Product Measurement International Conferences IWSM 2009 and Mensura 2009 Amsterdam, The Netherlands, November 4-6, 2009. Proceedings ent://SD_ILS/0/SD_ILS:191262 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Abran, Alain. editor.&#160;Braungarten, Ren&eacute;. editor.&#160;Dumke, Reiner R. editor.&#160;Cuadrado-Gallego, Juan J. editor.&#160;Brunekreef, Jacob. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-05415-0">http://dx.doi.org/10.1007/978-3-642-05415-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software Process and Product Measurement International Conference, IWSM-Mensura 2007, Palma de Mallorca, Spain, November 5-8, 2007. Revised Papers ent://SD_ILS/0/SD_ILS:188722 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Cuadrado-Gallego, Juan J. editor.&#160;Braungarten, Ren&eacute;. editor.&#160;Dumke, Reiner R. editor.&#160;Abran, Alain. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-85553-8">http://dx.doi.org/10.1007/978-3-540-85553-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software Process and Product Measurement International Conferences IWSM 2008, Metrikon 2008, and Mensura 2008 Munich, Germany, November 18-19, 2008. Proceedings ent://SD_ILS/0/SD_ILS:189262 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Dumke, Reiner R. editor.&#160;Braungarten, Ren&eacute;. editor.&#160;B&uuml;ren, G&uuml;nter. editor.&#160;Abran, Alain. editor.&#160;Cuadrado-Gallego, Juan J. editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-89403-2">http://dx.doi.org/10.1007/978-3-540-89403-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> The IT Measurement Compendium Estimating and Benchmarking Success with Functional Size Measurement ent://SD_ILS/0/SD_ILS:185392 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Bundschuh, Manfred. author.&#160;Dekkers, Carol. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-540-68188-5">http://dx.doi.org/10.1007/978-3-540-68188-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Best Practices in Software Measurement How to use metrics to improve project and process performance ent://SD_ILS/0/SD_ILS:180938 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Ebert, Christof. author.&#160;Bundschuh, Manfred. author.&#160;Dumke, Reiner. author.&#160;Schmietendorf, Andreas. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b138013">http://dx.doi.org/10.1007/b138013</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Autonomous Sensor Networks Collective Sensing Strategies for Analytical Purposes ent://SD_ILS/0/SD_ILS:333878 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Filippini, Daniel. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333878.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-34648-4">http://dx.doi.org/10.1007/978-3-642-34648-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Software engineering for image processing systems ent://SD_ILS/0/SD_ILS:286473 2024-09-03T03:53:12Z 2024-09-03T03:53:12Z Author&#160;Laplante, Phillip A.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9780203496107">Distributed by publisher. 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