Search Results for Measurement . - Narrowed by: Surfaces (Physics).
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMeasurement$0025C2$0025A0$0025C2$0025A0$0025C2$0025A0.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026te$003dILS$0026ps$003d300?
2024-09-03T06:12:01Z
Evaluating Measurement Accuracy A Practical Approach
ent://SD_ILS/0/SD_ILS:332097
2024-09-03T06:12:01Z
2024-09-03T06:12:01Z
Author Rabinovich, Semyon G. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332097.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-6717-5">http://dx.doi.org/10.1007/978-1-4614-6717-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical Measurement of Surface Topography
ent://SD_ILS/0/SD_ILS:191860
2024-09-03T06:12:01Z
2024-09-03T06:12:01Z
Author Leach, Richard. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-12012-1">http://dx.doi.org/10.1007/978-3-642-12012-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Evaluating Measurement Accuracy A Practical Approach
ent://SD_ILS/0/SD_ILS:172252
2024-09-03T06:12:01Z
2024-09-03T06:12:01Z
Author Rabinovich, Semyon G. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-1456-9">http://dx.doi.org/10.1007/978-1-4419-1456-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Springer Handbook of Materials Measurement Methods
ent://SD_ILS/0/SD_ILS:182291
2024-09-03T06:12:01Z
2024-09-03T06:12:01Z
Author Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-30300-8">http://dx.doi.org/10.1007/978-3-540-30300-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Units of Measurement Past, Present and Future. International System of Units
ent://SD_ILS/0/SD_ILS:189790
2024-09-03T06:12:01Z
2024-09-03T06:12:01Z
Author Gupta, S. V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-00738-5">http://dx.doi.org/10.1007/978-3-642-00738-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Ellipsometry at the Nanoscale
ent://SD_ILS/0/SD_ILS:333782
2024-09-03T06:12:01Z
2024-09-03T06:12:01Z
Author Losurdo, Maria. editor. Hingerl, Kurt. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333782.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33956-1">http://dx.doi.org/10.1007/978-3-642-33956-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nondestructive Testing of Materials and Structures
ent://SD_ILS/0/SD_ILS:335698
2024-09-03T06:12:01Z
2024-09-03T06:12:01Z
Author Büyüköztürk, Oral. author. Taşdemir, Mehmet Ali. author. Güneş, Oğuz. editor. Akkaya, Yılmaz. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(335698.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-0723-8">http://dx.doi.org/10.1007/978-94-007-0723-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computational Electromagnetics and Model-Based Inversion A Modern Paradigm for Eddy-Current Nondestructive Evaluation
ent://SD_ILS/0/SD_ILS:330843
2024-09-03T06:12:01Z
2024-09-03T06:12:01Z
Author Sabbagh, Harold A. author. Murphy, R. Kim. author. Sabbagh, Elias H. author. Aldrin, John C. author. Knopp, Jeremy S. author.<br/>Preferred Shelf Number ONLINE(330843.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-8429-6">http://dx.doi.org/10.1007/978-1-4419-8429-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>