Search Results for Measurement&nbsp;&nbsp;&nbsp;. - Narrowed by: Systems engineering. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMeasurement$0025C2$0025A0$0025C2$0025A0$0025C2$0025A0.$0026qf$003dSUBJECT$002509Subject$002509Systems$002bengineering.$002509Systems$002bengineering.$0026te$003dILS$0026ps$003d300? 2024-09-03T00:40:33Z Contactless VLSI Measurement and Testing Techniques ent://SD_ILS/0/SD_ILS:401142 2024-09-03T00:40:33Z 2024-09-03T00:40:33Z Author&#160;Sayil, Selahattin. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-69673-7">https://doi.org/10.1007/978-3-319-69673-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Instrumentation, Measurement, Circuits and Systems ent://SD_ILS/0/SD_ILS:196167 2024-09-03T00:40:33Z 2024-09-03T00:40:33Z Author&#160;Zhang, Tianbiao. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-27334-6">http://dx.doi.org/10.1007/978-3-642-27334-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Functional Verification Coverage Measurement and Analysis ent://SD_ILS/0/SD_ILS:170041 2024-09-03T00:40:33Z 2024-09-03T00:40:33Z Author&#160;Piziali, Andrew. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b117979">http://dx.doi.org/10.1007/b117979</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Supportability engineering handbook implementation, measurement, and management ent://SD_ILS/0/SD_ILS:293555 2024-09-03T00:40:33Z 2024-09-03T00:40:33Z Author&#160;Jones, James V.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/supportability-engineering-handbook">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Compact Models and Measurement Techniques for High-Speed Interconnects ent://SD_ILS/0/SD_ILS:173845 2024-09-03T00:40:33Z 2024-09-03T00:40:33Z Author&#160;Sharma, Rohit. author.&#160;Chakravarty, Tapas. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-1071-3">http://dx.doi.org/10.1007/978-1-4614-1071-3</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors ent://SD_ILS/0/SD_ILS:336233 2024-09-03T00:40:33Z 2024-09-03T00:40:33Z Author&#160;Im, Seongil. author.&#160;Chang, Youn-Gyoung. author.&#160;Kim, Jae Hoon. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(336233.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-94-007-6392-0">http://dx.doi.org/10.1007/978-94-007-6392-0</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Quantitative measurements for logistics ent://SD_ILS/0/SD_ILS:293604 2024-09-03T00:40:33Z 2024-09-03T00:40:33Z Author&#160;Frohne, Philip T.&#160;SOLE--The International Society of Logistics.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://mhebooklibrary.com/reader/quantitative-measurements-for-logistics">Subscription required</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Instrumentation design studies ent://SD_ILS/0/SD_ILS:291508 2024-09-03T00:40:33Z 2024-09-03T00:40:33Z Author&#160;Doebelin, Ernest O.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439819494">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>