Search Results for Measurement Science and Instrumentation. - Narrowed by: Nanotechnology.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMeasurement$002bScience$002band$002bInstrumentation.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?
2024-11-11T22:17:29Z
Ellipsometry at the Nanoscale
ent://SD_ILS/0/SD_ILS:333782
2024-11-11T22:17:29Z
2024-11-11T22:17:29Z
Author Losurdo, Maria. editor. Hingerl, Kurt. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333782.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33956-1">http://dx.doi.org/10.1007/978-3-642-33956-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Surface Science Techniques
ent://SD_ILS/0/SD_ILS:333819
2024-11-11T22:17:29Z
2024-11-11T22:17:29Z
Author Bracco, Gianangelo. editor. Holst, Bodil. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333819.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-34243-1">http://dx.doi.org/10.1007/978-3-642-34243-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>