Search Results for Measurement Science and Instrumentation. - Narrowed by: Nanotechnology.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMeasurement$002bScience$002band$002bInstrumentation.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026te$003dILS$0026ps$003d300?
2025-01-20T16:22:48Z
Handbook of Metrology and Applications
ent://SD_ILS/0/SD_ILS:528422
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2025-01-20T16:22:48Z
Author Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-2074-7">https://doi.org/10.1007/978-981-99-2074-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Ellipsometry at the Nanoscale
ent://SD_ILS/0/SD_ILS:333782
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2025-01-20T16:22:48Z
Author Losurdo, Maria. editor. Hingerl, Kurt. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333782.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-33956-1">http://dx.doi.org/10.1007/978-3-642-33956-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Surface Science Techniques
ent://SD_ILS/0/SD_ILS:333819
2025-01-20T16:22:48Z
2025-01-20T16:22:48Z
Author Bracco, Gianangelo. editor. Holst, Bodil. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333819.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-34243-1">http://dx.doi.org/10.1007/978-3-642-34243-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>