Search Results for Measurement. - Narrowed by: Software measurement.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMeasurement.$0026qf$003dSUBJECT$002509Subject$002509Software$002bmeasurement.$002509Software$002bmeasurement.$0026te$003dILS$0026ps$003d300?dt=list2025-03-17T17:53:15ZSoftware engineering measurementent://SD_ILS/0/SD_ILS:2891242025-03-17T17:53:15Z2025-03-17T17:53:15ZAuthor Munson, John C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203011188">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Software measurement and estimation a practical approachent://SD_ILS/0/SD_ILS:2494722025-03-17T17:53:15Z2025-03-17T17:53:15ZAuthor Laird, Linda M., 1952- Brennan, M. Carol, 1954- IEEE Computer Society. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896">http://ieeexplore.ieee.org/servlet/opac?bknumber=5988896</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The IFPUG guide to IT and software measurementent://SD_ILS/0/SD_ILS:2880522025-03-17T17:53:15Z2025-03-17T17:53:15ZAuthor International Function Point Users Group.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439869345">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Applied software measurement global analysis of productivity and qualityent://SD_ILS/0/SD_ILS:2933302025-03-17T17:53:15Z2025-03-17T17:53:15ZAuthor Jones, Capers.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/applied-software-measurement">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Software metrics : a rigorous and practical approachent://SD_ILS/0/SD_ILS:3567962025-03-17T17:53:15Z2025-03-17T17:53:15ZAuthor Fenton, Norman E., 1956- author. Bieman, James, author.<br/>Preferred Shelf Number ONLINE(356796.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439838235">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>COSMIC function points theory and advanced practicesent://SD_ILS/0/SD_ILS:2888762025-03-17T17:53:15Z2025-03-17T17:53:15ZAuthor Dumke, Reiner. Abran, Alain, 1949-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439844878">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality assurance of agent-based and self-managed systemsent://SD_ILS/0/SD_ILS:2850722025-03-17T17:53:15Z2025-03-17T17:53:15ZAuthor Dumke, Reiner. Mencke, Steffen. Wille, Cornelius.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439812679">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Software metrics a guide to planning, analysis, and applicationent://SD_ILS/0/SD_ILS:2864492025-03-17T17:53:15Z2025-03-17T17:53:15ZAuthor Pandian, C. Ravindranath.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9780203496077">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>