Search Results for Measurement. - Narrowed by: Systems engineering.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMeasurement.$0026qf$003dSUBJECT$002509Subject$002509Systems$002bengineering.$002509Systems$002bengineering.$0026te$003dILS$0026ps$003d300?
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Contactless VLSI Measurement and Testing Techniques
ent://SD_ILS/0/SD_ILS:401142
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Author Sayil, Selahattin. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-69673-7">https://doi.org/10.1007/978-3-319-69673-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Instrumentation, Measurement, Circuits and Systems
ent://SD_ILS/0/SD_ILS:196167
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Author Zhang, Tianbiao. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-27334-6">http://dx.doi.org/10.1007/978-3-642-27334-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Functional Verification Coverage Measurement and Analysis
ent://SD_ILS/0/SD_ILS:170041
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Author Piziali, Andrew. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b117979">http://dx.doi.org/10.1007/b117979</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Supportability engineering handbook implementation, measurement, and management
ent://SD_ILS/0/SD_ILS:293555
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Author Jones, James V.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/supportability-engineering-handbook">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Compact Models and Measurement Techniques for High-Speed Interconnects
ent://SD_ILS/0/SD_ILS:173845
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Author Sharma, Rohit. author. Chakravarty, Tapas. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-1071-3">http://dx.doi.org/10.1007/978-1-4614-1071-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Photo-Excited Charge Collection Spectroscopy Probing the traps in field-effect transistors
ent://SD_ILS/0/SD_ILS:336233
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Author Im, Seongil. author. Chang, Youn-Gyoung. author. Kim, Jae Hoon. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(336233.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-94-007-6392-0">http://dx.doi.org/10.1007/978-94-007-6392-0</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Quantitative measurements for logistics
ent://SD_ILS/0/SD_ILS:293604
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Author Frohne, Philip T. SOLE--The International Society of Logistics.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/quantitative-measurements-for-logistics">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Instrumentation design studies
ent://SD_ILS/0/SD_ILS:546041
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Author Doebelin, Ernest O., author.<br/>Preferred Shelf Number TA165 .D547 2010<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439819494">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>