Search Results for Meeker, William Q.,SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMeeker$00252C$002bWilliam$002bQ.$00252C$0026ps$003d300?dt=list2026-06-03T20:25:19ZStatistical intervals : a guide for practitioners and researchers.ent://SD_ILS/0/SD_ILS:5935042026-06-03T20:25:19Z2026-06-03T20:25:19ZAuthor Meeker, William Q. Hahn, Gerald J. Escobar, Luis A.<br/>Preferred Shelf Number QA276 .H22 2017 EB<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781118594841">https://onlinelibrary.wiley.com/doi/book/10.1002/9781118594841</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Statistical methods for reliability dataent://SD_ILS/0/SD_ILS:850802026-06-03T20:25:19Z2026-06-03T20:25:19ZAuthor Meeker, William Q. Escobar, Luis A., ort. yaz.<br/>Preferred Shelf Number TS 173 M44 1998<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Statistical intervals a guide for practitionersent://SD_ILS/0/SD_ILS:2952572026-06-03T20:25:19Z2026-06-03T20:25:19ZAuthor Hahn, Gerald J. Meeker, William Q. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470316771">An electronic book accessible through the World Wide Web; click for information</a>
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HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/23139974.html">http://catalog.hathitrust.org/api/volumes/oclc/23139974.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Achieving Product Reliability : A Key to Business Success.ent://SD_ILS/0/SD_ILS:5634782026-06-03T20:25:19Z2026-06-03T20:25:19ZAuthor Doganaksoy, Necip, 1960- author. Meeker, William Q., author. Hahn, Gerald J., author.<br/>Preferred Shelf Number TS156<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9781003181361">https://www.taylorfrancis.com/books/9781003181361</a>
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