Search Results for Metal oxide semiconductor field-effect transistors.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetal$002boxide$002bsemiconductor$002bfield-effect$002btransistors.$0026pe$003dd$00253A$0026ps$003d300?2024-11-12T06:07:13ZStrain-engineered MOSFETsent://SD_ILS/0/SD_ILS:2881472024-11-12T06:07:13Z2024-11-12T06:07:13ZAuthor Maiti, C. K. Maiti, T. K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466503472">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Technology computer aided design simulation for VLSI MOSFETent://SD_ILS/0/SD_ILS:2909522024-11-12T06:07:13Z2024-11-12T06:07:13ZAuthor Sarkar, Chandan Kumar, editor of compilation.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781466512665">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of innovative nanomaterials from syntheses to applicationsent://SD_ILS/0/SD_ILS:2917192024-11-12T06:07:13Z2024-11-12T06:07:13ZAuthor Fang, Xiaosheng. Wu, Limin.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9789814303903">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>CMOS circuit design, layout, and simulationent://SD_ILS/0/SD_ILS:2984872024-11-12T06:07:13Z2024-11-12T06:07:13ZAuthor Baker, R. Jacob, 1964- Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9780470891179">An electronic book accessible through the World Wide Web; click for information</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Compact MOSFET models for VLSI designent://SD_ILS/0/SD_ILS:2495822024-11-12T06:07:13Z2024-11-12T06:07:13ZAuthor Bhattacharyya, A. B. (Amalendu Bhushan) Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5681002">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5681002</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Defects in microelectronic materials and devicesent://SD_ILS/0/SD_ILS:2860102024-11-12T06:07:13Z2024-11-12T06:07:13ZAuthor Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Strained-Si heterostructure field effect devicesent://SD_ILS/0/SD_ILS:2893692024-11-12T06:07:13Z2024-11-12T06:07:13ZAuthor Maiti, C. K. Chattopadhyay, Swapan, 1952- Bera, L. K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420012347">Distributed by publisher. 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