Search Results for Metal oxide semiconductors, Complementary -- Reliability.
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetal$002boxide$002bsemiconductors$00252C$002bComplementary$002b--$002bReliability.$0026ps$003d300?
2024-08-29T21:57:52Z
Transient-induced latchup in CMOS integrated circuits
ent://SD_ILS/0/SD_ILS:249785
2024-08-29T21:57:52Z
2024-08-29T21:57:52Z
Author Ker, Ming-Dou. Hsu, Sheng-Fu.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability wearout mechanisms in advanced CMOS technologies
ent://SD_ILS/0/SD_ILS:249574
2024-08-29T21:57:52Z
2024-08-29T21:57:52Z
Author Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>