Search Results for Metal oxide semiconductors -- Reliability.
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetal$002boxide$002bsemiconductors$002b--$002bReliability.$0026ic$003dtrue$0026ps$003d300?dt=list
2026-03-22T02:07:47Z
Nanotechnology in electronics : materials, properties, devices
ent://SD_ILS/0/SD_ILS:597956
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Author P. M., Visakh, editor. Semkin, Artem, editor. B., Raneesh, 1986- editor. Lazović, Saša, editor.<br/>Preferred Shelf Number TK7874.84<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527824229">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527824229</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Metal oxide nanocomposite thin films for optoelectronic device applications
ent://SD_ILS/0/SD_ILS:598580
2026-03-22T02:07:47Z
2026-03-22T02:07:47Z
Author Zargar, Rayees Ahmad, editor.<br/>Preferred Shelf Number TA418.9 .T45 M48 2023<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865636">https://onlinelibrary.wiley.com/doi/book/10.1002/9781119865636</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Semiconductor process reliability in practice
ent://SD_ILS/0/SD_ILS:293479
2026-03-22T02:07:47Z
2026-03-22T02:07:47Z
Author Gan, Zhenghao. Wong, Waisum. Liou, Juin J.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://mhebooklibrary.com/reader/semiconductor-process-reliability-in-practice">Subscription required</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability wearout mechanisms in advanced CMOS technologies
ent://SD_ILS/0/SD_ILS:249574
2026-03-22T02:07:47Z
2026-03-22T02:07:47Z
Author Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transient-induced latchup in CMOS integrated circuits
ent://SD_ILS/0/SD_ILS:249785
2026-03-22T02:07:47Z
2026-03-22T02:07:47Z
Author Ker, Ming-Dou. Hsu, Sheng-Fu.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>