Search Results for Metal oxide semiconductors. - Narrowed by: 2009
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetal$002boxide$002bsemiconductors.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092009$0025092009$0026ps$003d300?
2024-10-31T00:50:17Z
Electronic device architectures for the nano-CMOS era from ultimate CMOS scaling to beyond CMOS devices
ent://SD_ILS/0/SD_ILS:286217
2024-10-31T00:50:17Z
2024-10-31T00:50:17Z
Author Deleonibus, Simon.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9789814241298">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability wearout mechanisms in advanced CMOS technologies
ent://SD_ILS/0/SD_ILS:249574
2024-10-31T00:50:17Z
2024-10-31T00:50:17Z
Author Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Nano-CMOS design for manufacturability robust circuit and physical design for sub-65 nm technology nodes
ent://SD_ILS/0/SD_ILS:297388
2024-10-31T00:50:17Z
2024-10-31T00:50:17Z
Author Wong, Ban P., 1953-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=413074">Click here to view book</a>
Knovel <a href="http://app.knovel.com/web/toc.v/cid:kpNCMOSDM2">http://app.knovel.com/web/toc.v/cid:kpNCMOSDM2</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470382820">http://dx.doi.org/10.1002/9780470382820</a>
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=413074_0">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=413074_0</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10278707">http://site.ebrary.com/lib/alltitles/Doc?id=10278707</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transient-induced latchup in CMOS integrated circuits
ent://SD_ILS/0/SD_ILS:249785
2024-10-31T00:50:17Z
2024-10-31T00:50:17Z
Author Ker, Ming-Dou. Hsu, Sheng-Fu.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>