Search Results for Metal oxide semiconductors. - Narrowed by: 2014 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetal$002boxide$002bsemiconductors.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092014$0025092014$0026ic$003dtrue$0026ps$003d300?dt=list 2024-11-28T02:11:49Z Novel advances in microsystems technologies and their applications ent://SD_ILS/0/SD_ILS:287274 2024-11-28T02:11:49Z 2024-11-28T02:11:49Z Author&#160;Francis, Laurent A., editor.&#160;Iniewski, Krzysztof, 1960- editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781466560673">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Beyond-CMOS nanodevices 2 ent://SD_ILS/0/SD_ILS:342107 2024-11-28T02:11:49Z 2024-11-28T02:11:49Z Author&#160;Balestra, Francis, editor.<br/>Preferred Shelf Number&#160;ONLINE(342107.1)<br/>Electronic Access&#160;ebrary <a href="http://alltitles.ebrary.com/Doc?id=10879742">An electronic book accessible through the World Wide Web; click to view</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118985137">http://dx.doi.org/10.1002/9781118985137</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Testing for small-delay defects in nanoscale CMOS integrated circuits ent://SD_ILS/0/SD_ILS:342881 2024-11-28T02:11:49Z 2024-11-28T02:11:49Z Author&#160;Goel, Sandeep K, editor of compilation.&#160;Chakrabarty, Krishnendu, editor of compilation.<br/>Preferred Shelf Number&#160;ONLINE(342881.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439829424">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Beyond-CMOS Nanodevices 1 ent://SD_ILS/0/SD_ILS:342103 2024-11-28T02:11:49Z 2024-11-28T02:11:49Z Author&#160;Balestra, Francis.<br/>Preferred Shelf Number&#160;ONLINE(342103.1)<br/>Electronic Access&#160;Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1706877">http://public.eblib.com/choice/publicfullrecord.aspx?p=1706877</a> ebrary <a href="http://site.ebrary.com/id/10879744">http://site.ebrary.com/id/10879744</a> John Wiley <a href="http://dx.doi.org/10.1002/9781118984772">http://dx.doi.org/10.1002/9781118984772</a> MyiLibrary <a href="http://www.myilibrary.com?id=621893">http://www.myilibrary.com?id=621893</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> High performance silicon imaging : fundamentals and applications CMOS and CCD sensors ent://SD_ILS/0/SD_ILS:355761 2024-11-28T02:11:49Z 2024-11-28T02:11:49Z Author&#160;Durini, Daniel, editor.<br/>Preferred Shelf Number&#160;ONLINE(355761.1)<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780857095985">http://www.sciencedirect.com/science/book/9780857095985</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanostructured semiconductor oxides for the next generation of electronics and functional devices : properties and applications ent://SD_ILS/0/SD_ILS:355966 2024-11-28T02:11:49Z 2024-11-28T02:11:49Z Author&#160;Zhuiykov, Serge, author.<br/>Preferred Shelf Number&#160;ONLINE(355966.1)<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781782422204">http://www.sciencedirect.com/science/book/9781782422204</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>