Search Results for Methodology - Narrowed by: Beytepe CD-ROM KoleksiyonuSirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMethodology$0026qf$003dLOCATION$002509Shelf$002bLocation$0025091$00253ABEYTEPECDR$002509Beytepe$002bCD-ROM$002bKoleksiyonu$0026ps$003d300$0026isd$003dtrue?2024-10-28T23:14:36ZOptical bit error rate : an estimation methodologyent://SD_ILS/0/SD_ILS:1194802024-10-28T23:14:36Z2024-10-28T23:14:36ZAuthor Kartalopoulos, Stamatios V.<br/>Preferred Shelf Number TK5103.59 K363 2004<br/>Format: Books<br/>Availability Beytepe Library~2<br/>The practice of social researchent://SD_ILS/0/SD_ILS:1110752024-10-28T23:14:36Z2024-10-28T23:14:36ZAuthor Babbie, Earl R.<br/>Preferred Shelf Number H 62 B2 2007<br/>Format: Books<br/>Availability Beytepe Library~2<br/>The practice of social researchent://SD_ILS/0/SD_ILS:964302024-10-28T23:14:36Z2024-10-28T23:14:36ZAuthor Babbie, Earl R.<br/>Preferred Shelf Number H 62 B2 2004<br/>Format: Books<br/>Availability Beytepe Library~2<br/>Ancient muses : archaeology and the artsent://SD_ILS/0/SD_ILS:858562024-10-28T23:14:36Z2024-10-28T23:14:36ZAuthor Jameson, John H., ed. Ehrenhard, John E., ed. Finn, Christine, 1959- ed.<br/>Preferred Shelf Number CC 75.7 A53 2003<br/>Format: Books<br/>Availability Beytepe Library~3<br/>Imaging spectrometry : basic principles and prospective applicationsent://SD_ILS/0/SD_ILS:937672024-10-28T23:14:36Z2024-10-28T23:14:36ZAuthor Meer, Freek van der, ed. Jong, Steven M. de, 1962- ed.<br/>Preferred Shelf Number QE 33.2.R4 I53 2001<br/>Format: Books<br/>Availability Beytepe Library~2<br/>