Search Results for Metric system.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetric$002bsystem.$0026ic$003dtrue$0026ps$003d300?2024-12-03T05:00:01ZStandard for use of the International System of Units (SI) : the modern metric systement://SD_ILS/0/SD_ILS:5163602024-12-03T05:00:01Z2024-12-03T05:00:01ZAuthor American Society for Testing and Materials.<br/>Preferred Shelf Number QC91 S82 1997<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Human Interface and the Management of Information Thematic Area, HIMI 2023, Held as Part of the 25th HCI International Conference, HCII 2023, Copenhagen, Denmark, July 23-28, 2023, Proceedings, Part Ient://SD_ILS/0/SD_ILS:5210342024-12-03T05:00:01Z2024-12-03T05:00:01ZAuthor Mori, Hirohiko. editor. Asahi, Yumi. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(521034.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-35132-7">https://doi.org/10.1007/978-3-031-35132-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Image and Graphics Technologies and Applications 18th Chinese Conference, IGTA 2023, Beijing, China, August 17-19, 2023, Revised Selected Papersent://SD_ILS/0/SD_ILS:5207182024-12-03T05:00:01Z2024-12-03T05:00:01ZAuthor Yongtian, Wang. editor. Lifang, Wu. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(520718.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-7549-5">https://doi.org/10.1007/978-981-99-7549-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Information Integration and Web Intelligence 25th International Conference, iiWAS 2023, Denpasar, Bali, Indonesia, December 4-6, 2023, Proceedingsent://SD_ILS/0/SD_ILS:5213362024-12-03T05:00:01Z2024-12-03T05:00:01ZAuthor Delir Haghighi, Pari. editor. Pardede, Eric. editor. Dobbie, Gillian. editor. Yogarajan, Vithya. editor. ER, Ngurah Agus Sanjaya. editor.<br/>Preferred Shelf Number XX(521336.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-48316-5">https://doi.org/10.1007/978-3-031-48316-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer Aided Verification 27th International Conference, CAV 2015, San Francisco, CA, USA, July 18-24, 2015, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5190282024-12-03T05:00:01Z2024-12-03T05:00:01ZAuthor Kroening, Daniel. editor. Păsăreanu, Corina S. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(519028.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-21668-3">https://doi.org/10.1007/978-3-319-21668-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5191852024-12-03T05:00:01Z2024-12-03T05:00:01ZAuthor Kryszkiewicz, Marzena. editor. Bandyopadhyay, Sanghamitra. editor. Rybinski, Henryk. editor. Pal, Sankar K. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(519185.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-19941-2">https://doi.org/10.1007/978-3-319-19941-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>MultiMedia Modeling 21st International Conference, MMM 2015, Sydney, Australia, January 5-7, 2015, Proceedings, Part IIent://SD_ILS/0/SD_ILS:5191932024-12-03T05:00:01Z2024-12-03T05:00:01ZAuthor He, Xiangjian. editor. Luo, Suhuai. editor. Tao, Dacheng. editor. Xu, Changsheng. editor. Yang, Jie. editor.<br/>Preferred Shelf Number XX(519193.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-14442-9">https://doi.org/10.1007/978-3-319-14442-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Web Technologies and Applications 17th Asia-Pacific Web Conference, APWeb 2015, Guangzhou, China, September 18-20, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5188372024-12-03T05:00:01Z2024-12-03T05:00:01ZAuthor Cheng, Reynold. editor. Cui, Bin. editor. Zhang, Zhenjie. editor. Cai, Ruichu. editor. Xu, Jia. editor.<br/>Preferred Shelf Number XX(518837.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-25255-1">https://doi.org/10.1007/978-3-319-25255-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5190352024-12-03T05:00:01Z2024-12-03T05:00:01ZAuthor Paredes, Roberto. editor. Cardoso, Jaime S. editor. Pardo, Xosé M. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(519035.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-19390-8">https://doi.org/10.1007/978-3-319-19390-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Metric handbook planning and design dataent://SD_ILS/0/SD_ILS:2594372024-12-03T05:00:01Z2024-12-03T05:00:01ZAuthor Littlefield, David.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.tandfebooks.com/isbn/9780080963419">Click here to view</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Systems : differentiated curriculum for grade 4ent://SD_ILS/0/SD_ILS:3867802024-12-03T05:00:01Z2024-12-03T05:00:01ZAuthor Keiser, Debbie. Wolfinsohn, Sarah. McGee, Brenda. Bolt, Brandon. Triska, Linda.<br/>Preferred Shelf Number LB1523 S97 2008 V.1<br/>Format: Books<br/>Availability Beytepe Library~3<br/>Basic surveyingent://SD_ILS/0/SD_ILS:3588772024-12-03T05:00:01Z2024-12-03T05:00:01ZAuthor Whyte, W. S. (Walter S.) Paul, R. E. Whyte, W. S. (Walter S.) Basic metric surveying.<br/>Preferred Shelf Number TA545 W69 1997<br/>Format: Books<br/>Availability Beytepe Library~1<br/>