Search Results for Metrology - Narrowed by: Online Library
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Metrology
ent://SD_ILS/0/SD_ILS:485379
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Author Gao, Wei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-4938-5">https://doi.org/10.1007/978-981-10-4938-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Mass Metrology
ent://SD_ILS/0/SD_ILS:195336
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Author Gupta, S. V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-23412-5">http://dx.doi.org/10.1007/978-3-642-23412-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical metrology
ent://SD_ILS/0/SD_ILS:301055
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Author Gåsvik, Kjell J. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical metrology
ent://SD_ILS/0/SD_ILS:318819
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Author Gåsvik, Kjell J.<br/>Preferred Shelf Number ONLINE(318819.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226</a>
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John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a>
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Speckle metrology
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Author Erf, Robert K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780122413605">http://www.sciencedirect.com/science/book/9780122413605</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Comprehensive mass metrology
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Author Kochsiek, Manfred. Gläser, Michael, 1942- John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/43419333.html">http://catalog.hathitrust.org/api/volumes/oclc/43419333.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/3527602992">http://dx.doi.org/10.1002/3527602992</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Ultra-fast material metrology
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Author Horn, Alexander, PD Dr.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527627929">http://dx.doi.org/10.1002/9783527627929</a>
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Handbook of Metrology and Applications
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Author Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-2074-7">https://doi.org/10.1007/978-981-99-2074-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of optical dimensional metrology
ent://SD_ILS/0/SD_ILS:542598
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Author Harding, Kevin G.<br/>Preferred Shelf Number T50 .H268 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439854822">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Semiconductor strain metrology principles and applications
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Author Wong, Terence K. S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Instrumentation and metrology in oceanography
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Author Le Menn, Marc.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ebrary <a href="http://oclc-marc.ebrary.com/Doc?id=10684971">An electronic book accessible through the World Wide Web; click to view</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9781118561959">http://dx.doi.org/10.1002/9781118561959</a>
Table of contents <a href="http://catdir.loc.gov/catdir/enhancements/fy1303/2012025490-t.html">http://catdir.loc.gov/catdir/enhancements/fy1303/2012025490-t.html</a>
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Optical imaging and metrology advanced technologies
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Author Osten, Wolfgang. Reingand, Nadya.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
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Information Modeling for Interoperable Dimensional Metrology
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Author Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4471-2167-1">http://dx.doi.org/10.1007/978-1-4471-2167-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Springer Handbook of Metrology and Testing
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Author Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-16641-9">http://dx.doi.org/10.1007/978-3-642-16641-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Software metrics and software metrology
ent://SD_ILS/0/SD_ILS:249319
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Author Abran, Alain, 1949-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Computational Surface and Roundness Metrology
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Author Muralikrishnan, Bala. author. Raja, Jay. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-84800-297-5">http://dx.doi.org/10.1007/978-1-84800-297-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
X-ray metrology in semiconductor manufacturing
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Author Bowen, D. Keith (David Keith), 1940- author. Tanner, B. K. (Brian Keith)<br/>Preferred Shelf Number TK7874.58 .B69 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420005653">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Handbook of silicon semiconductor metrology
ent://SD_ILS/0/SD_ILS:547244
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Author Diebold, A. C. (Alain C.)<br/>Preferred Shelf Number TK7871.85 .H3337 2001<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135554842">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Metrology for Fire Experiments in Outdoor Conditions
ent://SD_ILS/0/SD_ILS:332373
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Author Silvani, Xavier. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332373.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-7962-8">http://dx.doi.org/10.1007/978-1-4614-7962-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
ent://SD_ILS/0/SD_ILS:195203
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Author Raza, Hassan. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-22984-8">http://dx.doi.org/10.1007/978-3-642-22984-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Distributed Large-Scale Dimensional Metrology New Insights
ent://SD_ILS/0/SD_ILS:168531
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Author Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-85729-543-9">http://dx.doi.org/10.1007/978-0-85729-543-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Digital holography for MEMS and microsystem metrology
ent://SD_ILS/0/SD_ILS:305732
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Author Asundi, Anand.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781119997290">http://dx.doi.org/10.1002/9781119997290</a>
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Advances in speckle metrology and related techniques
ent://SD_ILS/0/SD_ILS:306059
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Author Kaufmann, Guillermo H.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Wiley InterScience <a href="http://dx.doi.org/10.1002/9783527633852">An electronic book accessible through the World Wide Web; click for information</a>
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Handbook of optical metrology : principles and applications
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Author Yoshizawa, Toru, 1939-<br/>Preferred Shelf Number QC367 .H36 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420019513">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Metrology in industry the key for quality
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Author Collège français de métrologie. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612125">http://dx.doi.org/10.1002/9780470612125</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France
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Author International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611371">http://dx.doi.org/10.1002/9780470611371</a>
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HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/230183422.html">http://catalog.hathitrust.org/api/volumes/oclc/230183422.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Recent Advances in Metrology Select Proceedings of AdMet 2021
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Author Yadav, Sanjay. editor. Chaudhary, K.P. editor. Gahlot, Ajay. editor. Arya, Yogendra. editor. Dahiya, Aman. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-19-2468-2">https://doi.org/10.1007/978-981-19-2468-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems
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Author Diering, Magdalena. editor. Wieczorowski, Michał. editor. Brown, Christopher A. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-18682-1">https://doi.org/10.1007/978-3-030-18682-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Metrology and standardization of nanotechnology : protocols and industrial innovations
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Author Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1002/9783527800308">Wiley Online Library</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
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Author Vosk, Ted, author. Emery, A. F. (Ashley Francis), 1934- author.<br/>Preferred Shelf Number HV8073.5 .V67 2015<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439826201">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Fringe pattern analysis for optical metrology : theory, algorithms, and applications
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Author Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.<br/>Preferred Shelf Number ONLINE(342225.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a>
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Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology
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Author Osten, Wolfgang. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-642-36359-7">https://doi.org/10.1007/978-3-642-36359-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Performance-based gear metrology kinematic-transmission-error computation and diagnosis
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Author Mark, William D.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=449969">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118357903">http://dx.doi.org/10.1002/9781118357903</a>
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Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
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Author Boutier, A. (Alain)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1132535">Click here to view book</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9781118576847">http://dx.doi.org/10.1002/9781118576847</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of 3D machine vision : optical metrology and imaging
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Author Song, Zhang.<br/>Preferred Shelf Number TK8315 .H36 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439872208">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
A practical guide to optical metrology for thin films
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Author Quinten, Michael.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.msvu.ca:2048/login?url=http://www.msvu.eblib.com/patron/FullRecord.aspx?p=1037093">Check for Full Text</a> Access restricted: MSVU users only
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John Wiley <a href="http://dx.doi.org/10.1002/9783527664344">http://dx.doi.org/10.1002/9783527664344</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
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Author Proulx, Tom. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0228-2">http://dx.doi.org/10.1007/978-1-4614-0228-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks
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Fringe 2009 6th International Workshop on Advanced Optical Metrology
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Data Modeling for Metrology and Testing in Measurement Science
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Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal
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Microwave Circuit Theory and Foundations of Microwave Metrology
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Handbook of surface and nanometrology
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Author Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Preferred Shelf Number TA418.7 .W47 2011<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420082029">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Handbook of surface and nanometrology
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Advances in Integrated Design and Production II Proceedings of the 12th International Conference on Integrated Design and Production, CPI 2022, May 10-12, 2022, ENSAM, Rabat, Morocco
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Proceedings of CASICAM 2022
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Rotating Machinery, Optical Methods & Scanning LDV Methods, Volume 6 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022
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Sensors and Instrumentation, Aircraft/Aerospace and Dynamic Environments Testing, Volume 7 Proceedings of the 40th IMAC, A Conference and Exposition on Structural Dynamics 2022
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Recent Trends in Product Design and Intelligent Manufacturing Systems Select Proceedings of IPDIMS 2021
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Clinical and Laboratory Medicine Textbook
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Halal and Kosher Food Integration of Quality and Safety for Global Market Trends
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Proceedings of the International Conference on Information Control, Electrical Engineering and Rail Transit ICEERT 2022
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Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications
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Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings
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Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings
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Microstructuring of Thermo-Mechanically Highly Stressed Surfaces Final Report of the DFG Research Group 576
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Author Denkena, Berend. editor. Rienäcker, Adrian. editor. Knoll, Gunter. editor. Bach, Friedrich-Wilhelm. editor. Maier, Hans Jürgen. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-09692-6">https://doi.org/10.1007/978-3-319-09692-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Digital Holography and Wavefront Sensing Principles, Techniques and Applications
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Author Schnars, Ulf. author. Falldorf, Claas. author. Watson, John. author. Jüptner, Werner. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-662-44693-5">https://doi.org/10.1007/978-3-662-44693-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical devices in ophthalmology and optometry technology, design principles and clinical applications
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Author Donnerhacke, Karl-Heinz. Rill, Michael Stefan. Kaschke, Michael F.<br/>Preferred Shelf Number ONLINE(342196.1)<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527648962">http://dx.doi.org/10.1002/9783527648962</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Drills : science and technology of advanced operations
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Author Astakhov, Viktor P., author.<br/>Preferred Shelf Number TJ1260 .A87 2014<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781466584358">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Applications of EPR in Radiation Research
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Author Lund, Anders. editor. Shiotani, Masaru. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-09216-4">https://doi.org/10.1007/978-3-319-09216-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electrical impedance : principles, measurement, and applications
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Author Callegaro, Luca., author.<br/>Preferred Shelf Number QC522 .C35 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439849118">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Luminescence : the instrumental key to the future of nanotechnology
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Author Gilmore, Adam M., editor.<br/>Preferred Shelf Number QC476.5 .L86 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9789814267724">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Measurements with persons theory, methods, and implementation areas
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Author Berglund, Birgitta.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.tandfebooks.com/isbn/9780203816660">Click here to view</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
100 years of superconductivity
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Author Rogalla, H. (Horst) Kes, P. H. (Peter H.)<br/>Preferred Shelf Number QC611.96 .A16 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439849484">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Coordinate measuring machines and systems
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Fundamentals of laser micromachining
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Numeral Types and Changes Worldwide
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Author Bisang, Walter, contributor. Comrie, Bernard, contributor. Edelman, Džoj (Joy) I., contributor. Gvozdanovic, Jadranka, editor. Gvozdanović, Jadranka, contributor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1515/9783110811193">https://doi.org/10.1515/9783110811193</a>
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Computer network time synchronization : the Network Time Protocol on Earth and in space
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Author Mills, David L., author.<br/>Preferred Shelf Number TK5105.575 .M55 2011<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315218151">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Fundamental principles of engineering nanometrology
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Fundamental principles of engineering nanometrology
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Handbook of photonics for biomedical science
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Author Tuchin, V. V. (Valerii Viktorovich)<br/>Preferred Shelf Number R857 .O6 H366 2010<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439806296">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Microcomputed tomography : methodology and applications
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Author Stock, Stuart R., author.<br/>Preferred Shelf Number RC78.7 .T6 S73 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420058772">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Handbook of semiconductor manufacturing technology
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Author Doering, Robert, 1946- Nishi, Yoshio, 1940-<br/>Preferred Shelf Number TK7871.85 .H3335 2008<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315213934">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Microlithography : science and technology
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Author Suzuki, Kazuaki. Smith, Bruce W., 1959-<br/>Preferred Shelf Number TK7836 .M525 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420051537">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Optical inspection of microsystems
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Author Osten, Wolfgang.<br/>Preferred Shelf Number TS156.2 .O652 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420019162">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Financial justification of nondestructive testing : cost of quality in manufacturing
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Author Papadakis, Emmanuel P., author.<br/>Preferred Shelf Number TA417.2 .P37 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420009705">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Solid-state lasers and applications
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Author Sennaroglu, Alphan.<br/>Preferred Shelf Number TA1705 .S6748 2007<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781315222059">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Computer network time synchronization : the network time protocol
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Author Mills, David L., author.<br/>Preferred Shelf Number TK5105.5 .M564 2006<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420006155">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Handbook of photomask manufacturing technology
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Author Rizvi, Syed.<br/>Preferred Shelf Number TK7872 .M3 H36 2005<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420028782">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Handbook of Laser Technology and Applications (Three- Volume Set).
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Author Taylor and Francis.<br/>Preferred Shelf Number TA1675 .H363 2003<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/e/9781420050530">Click here to view.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Evaluating the measurement uncertainty : fundamentals and practical guidance
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Author Lira, Ignacio, 1951- author.<br/>Preferred Shelf Number T50<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367801564">https://www.taylorfrancis.com/books/9780367801564</a>
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Practical density measurement and hydrometry
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Author Gupta, S. V., author.<br/>Preferred Shelf Number QD169 .W3<br/>Electronic Access Taylor & Francis <a href="https://www.taylorfrancis.com/books/9780367801496">https://www.taylorfrancis.com/books/9780367801496</a>
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Handbook of mass measurement
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Author Jones, Frank E., author. Schoonover, Randall M.<br/>Preferred Shelf Number QC106 .J66 2002<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420038453">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Handbook of optical engineering
ent://SD_ILS/0/SD_ILS:542246
2025-12-20T00:30:38Z
2025-12-20T00:30:38Z
Author Malacara, Daniel, 1937- Thompson, Brian J.<br/>Preferred Shelf Number TA1520 .H368 2001<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781135556525">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Assessment of Oral Health : Diagnostic Techniques and Validation Criteria
ent://SD_ILS/0/SD_ILS:548684
2025-12-20T00:30:38Z
2025-12-20T00:30:38Z
Author Faller, R.V., editor.<br/>Preferred Shelf Number XX(548684.1)<br/>Electronic Access <a href="https://karger.com/book/doi/10.1159/isbn.978-3-318-00549-3">https://karger.com/book/doi/10.1159/isbn.978-3-318-00549-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>