Search Results for Metrology - Narrowed by: Electronic Library

Metrology

2024-11-14T20:50:50Z

Author Gao, Wei. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access https://doi.org/10.1007/978-981-10-4938-5
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Mass Metrology

2024-11-14T20:50:50Z

Author Gupta, S. V. author. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-3-642-23412-5
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Optical metrology

2024-11-14T20:50:50Z

Author Gåsvik, Kjell J. John Wiley & Sons.
Preferred Shelf Number ONLINE
Electronic Access John Wiley http://dx.doi.org/10.1002/0470855606
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Optical metrology

2024-11-14T20:50:50Z

Author Gåsvik, Kjell J.
Preferred Shelf Number ONLINE(318819.1)
Electronic Access Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226 EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=79534 MyiLibrary http://www.myilibrary.com?id=26972 John Wiley http://dx.doi.org/10.1002/0470855606 Table of contents http://catdir.loc.gov/catdir/toc/wiley023/2002072607.html
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Speckle metrology

2024-11-14T20:50:50Z

Author Erf, Robert K.
Preferred Shelf Number ONLINE
Electronic Access ScienceDirect http://www.sciencedirect.com/science/book/9780122413605
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Comprehensive mass metrology

2024-11-14T20:50:50Z

Author Kochsiek, Manfred. Gläser, Michael, 1942- John Wiley & Sons.
Preferred Shelf Number ONLINE
Electronic Access HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/43419333.html John Wiley http://dx.doi.org/10.1002/3527602992
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Ultra-fast material metrology

2024-11-14T20:50:50Z

Author Horn, Alexander, PD Dr.
Preferred Shelf Number ONLINE
Electronic Access Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071 John Wiley http://dx.doi.org/10.1002/9783527627929 http://site.ebrary.com/lib/alltitles/Doc?id=10332978
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Handbook of optical dimensional metrology

2024-11-14T20:50:50Z

Author Harding, Kevin G.
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Electronic Access Distributed by publisher. Purchase or institutional license may be required for access.
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Optical imaging and metrology advanced technologies

2024-11-14T20:50:50Z

Author Osten, Wolfgang. Reingand, Nadya.
Preferred Shelf Number ONLINE
Electronic Access Connect to MyiLibrary resource. http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916 Wiley http://dx.doi.org/10.1002/9783527648443 http://site.ebrary.com/lib/alltitles/Doc?id=10575536
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Semiconductor strain metrology principles and applications

2024-11-14T20:50:50Z

Author Wong, Terence K. S.
Preferred Shelf Number ONLINE
Electronic Access EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610
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Instrumentation and metrology in oceanography

2024-11-14T20:50:50Z

Author Le Menn, Marc.
Preferred Shelf Number ONLINE
Electronic Access ebrary An electronic book accessible through the World Wide Web; click to view Connect to MyiLibrary resource. John Wiley http://dx.doi.org/10.1002/9781118561959 Table of contents http://catdir.loc.gov/catdir/enhancements/fy1303/2012025490-t.html ebrary http://site.ebrary.com/id/10684971
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Information Modeling for Interoperable Dimensional Metrology

2024-11-14T20:50:50Z

Author Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-1-4471-2167-1
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Springer Handbook of Metrology and Testing

2024-11-14T20:50:50Z

Author Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-3-642-16641-9
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Software metrics and software metrology

2024-11-14T20:50:50Z

Author Abran, Alain, 1949-
Preferred Shelf Number ONLINE
Electronic Access IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6381791
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Computational Surface and Roundness Metrology

2024-11-14T20:50:50Z

Author Muralikrishnan, Bala. author. Raja, Jay. author. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-1-84800-297-5
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X-ray metrology in semiconductor manufacturing

2024-11-14T20:50:50Z

Author Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)
Preferred Shelf Number ONLINE
Electronic Access Distributed by publisher. Purchase or institutional license may be required for access.
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Handbook of silicon semiconductor metrology

2024-11-14T20:50:50Z

Author Diebold, A. C. (Alain C.)
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Metrology for Fire Experiments in Outdoor Conditions

2024-11-14T20:50:50Z

Author Silvani, Xavier. author. SpringerLink (Online service)
Preferred Shelf Number ONLINE(332373.1)
Electronic Access http://dx.doi.org/10.1007/978-1-4614-7962-8
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Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications

2024-11-14T20:50:50Z

Author Raza, Hassan. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-3-642-22984-8
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Distributed Large-Scale Dimensional Metrology New Insights

2024-11-14T20:50:50Z

Author Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-0-85729-543-9
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Digital holography for MEMS and microsystem metrology

2024-11-14T20:50:50Z

Author Asundi, Anand.
Preferred Shelf Number ONLINE
Electronic Access John Wiley http://dx.doi.org/10.1002/9781119997290 http://lib.myilibrary.com?id=317798 http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681
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Advances in speckle metrology and related techniques

2024-11-14T20:50:50Z

Author Kaufmann, Guillermo H.
Preferred Shelf Number ONLINE
Electronic Access Wiley InterScience An electronic book accessible through the World Wide Web; click for information Wiley InterScience - Full Text Online http://onlinelibrary.wiley.com/book/10.1002/9783527633852 http://site.ebrary.com/lib/alltitles/Doc?id=10446636
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Handbook of optical metrology principles and applications

2024-11-14T20:50:50Z

Author Yoshizawa, T?ru, 1939-
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Electronic Access Distributed by publisher. Purchase or institutional license may be required for access.
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Metrology in industry the key for quality

2024-11-14T20:50:50Z

Author Collège français de métrologie. Wiley InterScience (Online service)
Preferred Shelf Number ONLINE
Electronic Access Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html John Wiley http://dx.doi.org/10.1002/9780470612125
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Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, France

2024-11-14T20:50:50Z

Author International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)
Preferred Shelf Number ONLINE
Electronic Access Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706 John Wiley http://dx.doi.org/10.1002/9780470611371 http://site.ebrary.com/lib/alltitles/Doc?id=10360928 http://swb.eblib.com/patron/FullRecord.aspx?p=477706 HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/230183422.html
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Advances in Manufacturing II Volume 5 - Metrology and Measurement Systems

2024-11-14T20:50:50Z

Author Diering, Magdalena. editor. Wieczorowski, Michał. editor. Brown, Christopher A. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access https://doi.org/10.1007/978-3-030-18682-1
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Metrology and standardization of nanotechnology : protocols and industrial innovations

2024-11-14T20:50:50Z

Author Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.
Preferred Shelf Number ONLINE
Electronic Access Wiley Online Library
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Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists

2024-11-14T20:50:50Z

Author Vosk, Ted, author. Emery, A. F. (Ashley Francis), 1934- author.
Preferred Shelf Number ONLINE(357151.1)
Electronic Access Distributed by publisher. Purchase or institutional license may be required for access.
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Fringe 2013 7th International Workshop on Advanced Optical Imaging and Metrology

2024-11-14T20:50:50Z

Author Osten, Wolfgang. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access https://doi.org/10.1007/978-3-642-36359-7
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Fringe pattern analysis for optical metrology : theory, algorithms, and applications

2024-11-14T20:50:50Z

Author Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.
Preferred Shelf Number ONLINE(342225.1)
Electronic Access Ebook Library http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414 ebrary http://site.ebrary.com/id/10881255 John Wiley http://dx.doi.org/10.1002/9783527681075 MyiLibrary http://www.myilibrary.com?id=615339
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Handbook of 3D machine vision optical metrology and imaging

2024-11-14T20:50:50Z

Author Song, Zhang.
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Electronic Access Distributed by publisher. Purchase or institutional license may be required for access.
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Performance-based gear metrology kinematic-transmission-error computation and diagnosis

2024-11-14T20:50:50Z

Author Mark, William D.
Preferred Shelf Number ONLINE
Electronic Access Connect to MyiLibrary resource. John Wiley http://dx.doi.org/10.1002/9781118357903 Books24x7 http://www.books24x7.com/marc.asp?bookid=51229
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Laser metrology in fluid mechanics granulometry, temperature and concentration measurements

2024-11-14T20:50:50Z

Author Boutier, A. (Alain)
Preferred Shelf Number ONLINE
Electronic Access Ebook Library Click here to view book Connect to MyiLibrary resource. Wiley http://onlinelibrary.wiley.com/book/10.1002/9781118576847 John Wiley http://dx.doi.org/10.1002/9781118576847
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A practical guide to optical metrology for thin films

2024-11-14T20:50:50Z

Author Quinten, Michael.
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Electronic Access Check for Full Text Access restricted: MSVU users only Ebook Library Click here to view book Connect to MyiLibrary resource. John Wiley http://dx.doi.org/10.1002/9783527664344
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Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics

2024-11-14T20:50:50Z

Author Proulx, Tom. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-1-4614-0228-2
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The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocks

2024-11-14T20:50:50Z

Author Hebra, Alexius J. author. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-3-211-78381-8
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Data Modeling for Metrology and Testing in Measurement Science

2024-11-14T20:50:50Z

Author Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-0-8176-4804-6
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Fringe 2009 6th International Workshop on Advanced Optical Metrology

2024-11-14T20:50:50Z

Author Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-3-642-03051-2
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Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposal

2024-11-14T20:50:50Z

Author Meinrath, G. author. Schneider, Petra. author. SpringerLink (Online service)
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1007/978-3-540-71273-2
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Microwave Circuit Theory and Foundations of Microwave Metrology

2024-11-14T20:50:50Z

Author Engen, Glenn F.
Preferred Shelf Number ONLINE
Electronic Access http://dx.doi.org/10.1049/PBEL009E
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Handbook of surface and nanometrology

2024-11-14T20:50:50Z

Author Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.
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Handbook of surface and nanometrology

2024-11-14T20:50:50Z

Clinical and Laboratory Medicine Textbook

2024-11-14T20:50:50Z

Author Ciaccio, Marcello. editor. SpringerLink (Online service)
Preferred Shelf Number XX(522249.1)
Electronic Access https://doi.org/10.1007/978-3-031-24958-7
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Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications

2024-11-14T20:50:50Z

Author Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)
Preferred Shelf Number XX(518392.1)
Electronic Access https://doi.org/10.1007/978-1-4471-6741-9
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Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings

2024-11-14T20:50:50Z

Author Kryszkiewicz, Marzena. editor. Bandyopadhyay, Sanghamitra. editor. Rybinski, Henryk. editor. Pal, Sankar K. editor. SpringerLink (Online service)
Preferred Shelf Number XX(519185.1)
Electronic Access https://doi.org/10.1007/978-3-319-19941-2
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Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings

2024-11-14T20:50:50Z

Author Paredes, Roberto. editor. Cardoso, Jaime S. editor. Pardo, Xosé M. editor. SpringerLink (Online service)
Preferred Shelf Number XX(519035.1)
Electronic Access https://doi.org/10.1007/978-3-319-19390-8
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Optical devices in ophthalmology and optometry technology, design principles and clinical applications

2024-11-14T20:50:50Z

Author Donnerhacke, Karl-Heinz. Rill, Michael Stefan. Kaschke, Michael F.
Preferred Shelf Number ONLINE(342196.1)
Electronic Access John Wiley http://dx.doi.org/10.1002/9783527648962
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Electrical impedance principles, measurement, and applications

2024-11-14T20:50:50Z

Author Callegaro, Luca.
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Measurements with persons theory, methods, and implementation areas

2024-11-14T20:50:50Z

Author Berglund, Birgitta.
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Electronic Access Click here to view
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100 years of superconductivity

2024-11-14T20:50:50Z

Author Rogalla, H. (Horst) Kes, P. H. (Peter H.)
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Compound semiconductor radiation detectors

2024-11-14T20:50:50Z

Author Owens, Alan.
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Fundamentals of laser micromachining

2024-11-14T20:50:50Z

Author Schaeffer, Ronald D.
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Coordinate measuring machines and systems

2024-11-14T20:50:50Z

Author Hocken, Robert J. Pereira, Paulo H.
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Computer network time synchronization the Network Time Protocol on Earth and in space

2024-11-14T20:50:50Z

Author Mills, David L.
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Electronic Access Distributed by publisher. Purchase or institutional license may be required for access.
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Fundamental principles of engineering nanometrology

2024-11-14T20:50:50Z

Author Leach, R. K.
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Electronic Access ScienceDirect http://www.sciencedirect.com/science/book/9780080964546
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Handbook of photonics for biomedical science

2024-11-14T20:50:50Z

Author Tuchin, V. V. (Valeri? Viktorovich)
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Fundamental principles of engineering nanometrology

2024-11-14T20:50:50Z

Author Leach, R. K.
Preferred Shelf Number ONLINE(355774.1)
Electronic Access ScienceDirect http://www.sciencedirect.com/science/book/9781455777532 http://www.sciencedirect.com/science/book/9780080964546
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Computer network time synchronization the network time protocol

2024-11-14T20:50:50Z