Search Results for Metrology - Narrowed by: 2012SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetrology$0026qf$003dPUBDATE$002509Publication$002bDate$0025092012$0025092012$0026ic$003dtrue$0026ps$003d300?2025-03-16T13:42:51ZMass Metrologyent://SD_ILS/0/SD_ILS:1953362025-03-16T13:42:51Z2025-03-16T13:42:51ZAuthor Gupta, S. V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-23412-5">http://dx.doi.org/10.1007/978-3-642-23412-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Instrumentation and metrology in oceanographyent://SD_ILS/0/SD_ILS:3053952025-03-16T13:42:51Z2025-03-16T13:42:51ZAuthor Le Menn, Marc.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ebrary <a href="http://oclc-marc.ebrary.com/Doc?id=10684971">An electronic book accessible through the World Wide Web; click to view</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9781118561959">http://dx.doi.org/10.1002/9781118561959</a>
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ebrary <a href="http://site.ebrary.com/id/10684971">http://site.ebrary.com/id/10684971</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor strain metrology principles and applicationsent://SD_ILS/0/SD_ILS:2802052025-03-16T13:42:51Z2025-03-16T13:42:51ZAuthor Wong, Terence K. S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Optical imaging and metrology advanced technologiesent://SD_ILS/0/SD_ILS:3062112025-03-16T13:42:51Z2025-03-16T13:42:51ZAuthor Osten, Wolfgang. Reingand, Nadya.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
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Wiley <a href="http://dx.doi.org/10.1002/9783527648443">http://dx.doi.org/10.1002/9783527648443</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10575536">http://site.ebrary.com/lib/alltitles/Doc?id=10575536</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Graphene Nanoelectronics Metrology, Synthesis, Properties and Applicationsent://SD_ILS/0/SD_ILS:1952032025-03-16T13:42:51Z2025-03-16T13:42:51ZAuthor Raza, Hassan. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-22984-8">http://dx.doi.org/10.1007/978-3-642-22984-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A practical guide to optical metrology for thin filmsent://SD_ILS/0/SD_ILS:3062622025-03-16T13:42:51Z2025-03-16T13:42:51ZAuthor Quinten, Michael.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.msvu.ca:2048/login?url=http://www.msvu.eblib.com/patron/FullRecord.aspx?p=1037093">Check for Full Text</a> Access restricted: MSVU users only
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John Wiley <a href="http://dx.doi.org/10.1002/9783527664344">http://dx.doi.org/10.1002/9783527664344</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals of laser micromachiningent://SD_ILS/0/SD_ILS:2852672025-03-16T13:42:51Z2025-03-16T13:42:51ZAuthor Schaeffer, Ronald D.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439860564">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Compound semiconductor radiation detectorsent://SD_ILS/0/SD_ILS:2880442025-03-16T13:42:51Z2025-03-16T13:42:51ZAuthor Owens, Alan.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439873137">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Measurements with persons theory, methods, and implementation areasent://SD_ILS/0/SD_ILS:2623132025-03-16T13:42:51Z2025-03-16T13:42:51ZAuthor Berglund, Birgitta.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.tandfebooks.com/isbn/9780203816660">Click here to view</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>100 years of superconductivityent://SD_ILS/0/SD_ILS:2871152025-03-16T13:42:51Z2025-03-16T13:42:51ZAuthor Rogalla, H. (Horst) Kes, P. H. (Peter H.)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439849484">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Coordinate measuring machines and systemsent://SD_ILS/0/SD_ILS:2894452025-03-16T13:42:51Z2025-03-16T13:42:51ZAuthor Hocken, Robert J. Pereira, Paulo H.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420017533">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>