Search Results for Metrology - Narrowed by: 2015 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetrology$0026qf$003dPUBDATE$002509Publication$002bDate$0025092015$0025092015$0026ps$003d300?dt=list 2024-11-20T05:21:53Z Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists ent://SD_ILS/0/SD_ILS:357151 2024-11-20T05:21:53Z 2024-11-20T05:21:53Z Author&#160;Vosk, Ted, author.&#160;Emery, A. F. (Ashley Francis), 1934- author.<br/>Preferred Shelf Number&#160;ONLINE(357151.1)<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781439826201">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applications ent://SD_ILS/0/SD_ILS:518392 2024-11-20T05:21:53Z 2024-11-20T05:21:53Z Author&#160;Liu, Zheng. editor.&#160;Ukida, Hiroyuki. editor.&#160;Ramuhalli, Pradeep. editor.&#160;Niel, Kurt. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;XX(518392.1)<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-1-4471-6741-9">https://doi.org/10.1007/978-1-4471-6741-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedings ent://SD_ILS/0/SD_ILS:519185 2024-11-20T05:21:53Z 2024-11-20T05:21:53Z Author&#160;Kryszkiewicz, Marzena. editor.&#160;Bandyopadhyay, Sanghamitra. editor.&#160;Rybinski, Henryk. editor.&#160;Pal, Sankar K. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;XX(519185.1)<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-19941-2">https://doi.org/10.1007/978-3-319-19941-2</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedings ent://SD_ILS/0/SD_ILS:519035 2024-11-20T05:21:53Z 2024-11-20T05:21:53Z Author&#160;Paredes, Roberto. editor.&#160;Cardoso, Jaime S. editor.&#160;Pardo, Xos&eacute; M. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;XX(519035.1)<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-19390-8">https://doi.org/10.1007/978-3-319-19390-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>