Search Results for Metrology - Narrowed by: Metrology.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetrology$0026qf$003dSUBJECT$002509Subject$002509Metrology.$002509Metrology.$0026ic$003dtrue$0026ps$003d300?
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Ultra-fast material metrology
ent://SD_ILS/0/SD_ILS:304932
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Author Horn, Alexander, PD Dr.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527627929">http://dx.doi.org/10.1002/9783527627929</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10332978">http://site.ebrary.com/lib/alltitles/Doc?id=10332978</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Optical imaging and metrology advanced technologies
ent://SD_ILS/0/SD_ILS:306211
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Author Osten, Wolfgang. Reingand, Nadya.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916</a>
Wiley <a href="http://dx.doi.org/10.1002/9783527648443">http://dx.doi.org/10.1002/9783527648443</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10575536">http://site.ebrary.com/lib/alltitles/Doc?id=10575536</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Metrology in industry the key for quality
ent://SD_ILS/0/SD_ILS:297585
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Author Collège français de métrologie. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612125">http://dx.doi.org/10.1002/9780470612125</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Metrology and standardization of nanotechnology : protocols and industrial innovations
ent://SD_ILS/0/SD_ILS:424285
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Author Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1002/9783527800308">Wiley Online Library</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Forensic metrology : scientific measurement and inference for lawyers, judges and criminalists
ent://SD_ILS/0/SD_ILS:357151
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Author Vosk, Ted, author. Emery, A. F. (Ashley Francis), 1934- author.<br/>Preferred Shelf Number ONLINE(357151.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439826201">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Laser metrology in fluid mechanics granulometry, temperature and concentration measurements
ent://SD_ILS/0/SD_ILS:305416
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Author Boutier, A. (Alain)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1132535">Click here to view book</a>
<a href="http://lib.myilibrary.com?id=455462">Connect to MyiLibrary resource.</a>
Wiley <a href="http://onlinelibrary.wiley.com/book/10.1002/9781118576847">http://onlinelibrary.wiley.com/book/10.1002/9781118576847</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118576847">http://dx.doi.org/10.1002/9781118576847</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:355774
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Author Leach, R. K.<br/>Preferred Shelf Number ONLINE(355774.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:145816
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Author Leach, R. K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>