Search Results for Metrology - Narrowed by: Nanotechnologie.
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetrology$0026qf$003dSUBJECT$002509Subject$002509Nanotechnologie.$002509Nanotechnologie.$0026ps$003d300?dt=list
2026-06-05T09:48:17Z
Metrology and standardization of nanotechnology : protocols and industrial innovations
ent://SD_ILS/0/SD_ILS:593319
2026-06-05T09:48:17Z
2026-06-05T09:48:17Z
Author Mansfield, Elisabeth, (Research chemist), editor. Kaiser, Debra L., editor. Fujita, Daisuke (Materials scientist), editor. Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number T174.7<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308">https://onlinelibrary.wiley.com/doi/book/10.1002/9783527800308</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:355774
2026-06-05T09:48:17Z
2026-06-05T09:48:17Z
Author Leach, R. K.<br/>Preferred Shelf Number ONLINE(355774.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>