Search Results for MetrologySirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetrology$0026te$003dILS$0026ps$003d300?2024-09-10T23:27:42ZMetrologyent://SD_ILS/0/SD_ILS:4853792024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Gao, Wei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-4938-5">https://doi.org/10.1007/978-981-10-4938-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Mass Metrologyent://SD_ILS/0/SD_ILS:1953362024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Gupta, S. V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-23412-5">http://dx.doi.org/10.1007/978-3-642-23412-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Optical metrologyent://SD_ILS/0/SD_ILS:3010552024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Gåsvik, Kjell J. John Wiley & Sons.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Optical metrologyent://SD_ILS/0/SD_ILS:3188192024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Gåsvik, Kjell J.<br/>Preferred Shelf Number ONLINE(318819.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=146226</a>
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John Wiley <a href="http://dx.doi.org/10.1002/0470855606">http://dx.doi.org/10.1002/0470855606</a>
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John Wiley <a href="http://dx.doi.org/10.1002/3527602992">http://dx.doi.org/10.1002/3527602992</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Metrology for engineersent://SD_ILS/0/SD_ILS:474242024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Galyer, J. F. W. Shotbolt, C. R., ort. yaz.<br/>Preferred Shelf Number T 50 G3 1980<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Ultra-fast material metrologyent://SD_ILS/0/SD_ILS:3049322024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Horn, Alexander, PD Dr.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=482071</a>
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<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10332978">http://site.ebrary.com/lib/alltitles/Doc?id=10332978</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of optical dimensional metrologyent://SD_ILS/0/SD_ILS:2899682024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Harding, Kevin G.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439854822">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor strain metrology principles and applicationsent://SD_ILS/0/SD_ILS:2802052024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Wong, Terence K. S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Optical imaging and metrology advanced technologiesent://SD_ILS/0/SD_ILS:3062112024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Osten, Wolfgang. Reingand, Nadya.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
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<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of optical metrology principles and applicationsent://SD_ILS/0/SD_ILS:2857072024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Yoshizawa, T?ru, 1939-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420019513">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Metrology in industry the key for qualityent://SD_ILS/0/SD_ILS:2975852024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Collège français de métrologie. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612125">http://dx.doi.org/10.1002/9780470612125</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transverse disciplines in metrology proceedings of the 13th International Metrology Congress, 2007, Lille, Franceent://SD_ILS/0/SD_ILS:2979662024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor International Metrology Conference (13th : 2007 : French College of Metrology) Collège français de métrologie. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=477706</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470611371">http://dx.doi.org/10.1002/9780470611371</a>
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HathiTrust Digital Library, Limited view (search only) <a href="http://catalog.hathitrust.org/api/volumes/oclc/230183422.html">http://catalog.hathitrust.org/api/volumes/oclc/230183422.html</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in Manufacturing II Volume 5 - Metrology and Measurement Systemsent://SD_ILS/0/SD_ILS:4865942024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Diering, Magdalena. editor. Wieczorowski, Michał. editor. Brown, Christopher A. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-030-18682-1">https://doi.org/10.1007/978-3-030-18682-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Metrology and standardization of nanotechnology : protocols and industrial innovationsent://SD_ILS/0/SD_ILS:4242852024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1002/9783527800308">Wiley Online Library</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Forensic metrology : scientific measurement and inference for lawyers, judges and criminalistsent://SD_ILS/0/SD_ILS:3571512024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Vosk, Ted, author. Emery, A. F. (Ashley Francis), 1934- author.<br/>Preferred Shelf Number ONLINE(357151.1)<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439826201">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fringe pattern analysis for optical metrology : theory, algorithms, and applicationsent://SD_ILS/0/SD_ILS:3422252024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Servín, Manuel, author. Quiroga, J. Antonio (Juan Antonio), author. Padilla, J. Moisés (José Moisés), author.<br/>Preferred Shelf Number ONLINE(342225.1)<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414">http://public.eblib.com/choice/publicfullrecord.aspx?p=1701414</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9783527681075">http://dx.doi.org/10.1002/9783527681075</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9783527664344">http://dx.doi.org/10.1002/9783527664344</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanicsent://SD_ILS/0/SD_ILS:1736242024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Proulx, Tom. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-0228-2">http://dx.doi.org/10.1007/978-1-4614-0228-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>The Physics of Metrology All about Instruments: From Trundle Wheels to Atomic Clocksent://SD_ILS/0/SD_ILS:1770702024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Hebra, Alexius J. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-211-78381-8">http://dx.doi.org/10.1007/978-3-211-78381-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Data Modeling for Metrology and Testing in Measurement Scienceent://SD_ILS/0/SD_ILS:1682952024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Pavese, Franco. editor. Forbes, Alistair B. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-8176-4804-6">http://dx.doi.org/10.1007/978-0-8176-4804-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fringe 2009 6th International Workshop on Advanced Optical Metrologyent://SD_ILS/0/SD_ILS:1905032024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Osten, Wolfgang. editor. Kujawinska, Malgorzata. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03051-2">http://dx.doi.org/10.1007/978-3-642-03051-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Quality Assurance for Chemistry and Environmental Science Metrology from pH Measurement to Nuclear Waste Disposalent://SD_ILS/0/SD_ILS:1862312024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Meinrath, G. author. Schneider, Petra. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-71273-2">http://dx.doi.org/10.1007/978-3-540-71273-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Microwave Circuit Theory and Foundations of Microwave Metrologyent://SD_ILS/0/SD_ILS:2477702024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Engen, Glenn F.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1049/PBEL009E">http://dx.doi.org/10.1049/PBEL009E</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of surface and nanometrologyent://SD_ILS/0/SD_ILS:2897432024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420082029">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of surface and nanometrologyent://SD_ILS/0/SD_ILS:2858652024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Whitehouse, D. J. (David J.) Whitehouse, D. J. (David J.). Handbook of surface metrology.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420034196">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Clinical and Laboratory Medicine Textbookent://SD_ILS/0/SD_ILS:5222492024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Ciaccio, Marcello. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(522249.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-031-24958-7">https://doi.org/10.1007/978-3-031-24958-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Integrated Imaging and Vision Techniques for Industrial Inspection Advances and Applicationsent://SD_ILS/0/SD_ILS:5183922024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Liu, Zheng. editor. Ukida, Hiroyuki. editor. Ramuhalli, Pradeep. editor. Niel, Kurt. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(518392.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4471-6741-9">https://doi.org/10.1007/978-1-4471-6741-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pattern Recognition and Image Analysis 7th Iberian Conference, IbPRIA 2015, Santiago de Compostela, Spain, June 17-19, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5190352024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Paredes, Roberto. editor. Cardoso, Jaime S. editor. Pardo, Xosé M. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(519035.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-19390-8">https://doi.org/10.1007/978-3-319-19390-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Pattern Recognition and Machine Intelligence 6th International Conference, PReMI 2015, Warsaw, Poland, June 30 - July 3, 2015, Proceedingsent://SD_ILS/0/SD_ILS:5191852024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Kryszkiewicz, Marzena. editor. Bandyopadhyay, Sanghamitra. editor. Rybinski, Henryk. editor. Pal, Sankar K. editor. SpringerLink (Online service)<br/>Preferred Shelf Number XX(519185.1)<br/>Electronic Access <a href="https://doi.org/10.1007/978-3-319-19941-2">https://doi.org/10.1007/978-3-319-19941-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Optical devices in ophthalmology and optometry technology, design principles and clinical applicationsent://SD_ILS/0/SD_ILS:3421962024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Donnerhacke, Karl-Heinz. Rill, Michael Stefan. Kaschke, Michael F.<br/>Preferred Shelf Number ONLINE(342196.1)<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9783527648962">http://dx.doi.org/10.1002/9783527648962</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electrical impedance principles, measurement, and applicationsent://SD_ILS/0/SD_ILS:2899632024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Callegaro, Luca.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439849118">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Yasal metrolojient://SD_ILS/0/SD_ILS:3402572024-09-10T23:27:42Z2024-09-10T23:27:42ZPreferred Shelf Number QC89.T9 Y37 2013<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Compound semiconductor radiation detectorsent://SD_ILS/0/SD_ILS:2880442024-09-10T23:27:42Z2024-09-10T23:27:42ZAuthor Owens, Alan.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781439873137">Distributed by publisher. 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