Search Results for Metrology. - Narrowed by: 2006SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetrology.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092006$0025092006$0026pe$003dd$00253A$0026ps$003d300?dt=list2025-01-01T09:32:50ZX-ray metrology in semiconductor manufacturingent://SD_ILS/0/SD_ILS:2874432025-01-01T09:32:50Z2025-01-01T09:32:50ZAuthor Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420005653">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Metrology in industry the key for qualityent://SD_ILS/0/SD_ILS:2975852025-01-01T09:32:50Z2025-01-01T09:32:50ZAuthor Collège français de métrologie. Wiley InterScience (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Contributor biographical information <a href="http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html">http://catdir.loc.gov/catdir/enhancements/fy0806/2006003530-b.html</a>
John Wiley <a href="http://dx.doi.org/10.1002/9780470612125">http://dx.doi.org/10.1002/9780470612125</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Computer network time synchronization the network time protocolent://SD_ILS/0/SD_ILS:2911692025-01-01T09:32:50Z2025-01-01T09:32:50ZAuthor Mills, David L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420006155">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>