Search Results for Metrology. - Narrowed by: 2012SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetrology.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092012$0025092012$0026ps$003d300?dt=list2026-01-19T03:30:38ZMass Metrologyent://SD_ILS/0/SD_ILS:1953362026-01-19T03:30:38Z2026-01-19T03:30:38ZAuthor Gupta, S. V. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-23412-5">http://dx.doi.org/10.1007/978-3-642-23412-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Semiconductor strain metrology principles and applicationsent://SD_ILS/0/SD_ILS:2802052026-01-19T03:30:38Z2026-01-19T03:30:38ZAuthor Wong, Terence K. S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access EBSCOhost <a href="http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610">http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=500610</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Optical imaging and metrology advanced technologiesent://SD_ILS/0/SD_ILS:3062112026-01-19T03:30:38Z2026-01-19T03:30:38ZAuthor Osten, Wolfgang. Reingand, Nadya.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://lib.myilibrary.com?id=369321">Connect to MyiLibrary resource.</a>
<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=947916</a>
Wiley <a href="http://dx.doi.org/10.1002/9783527648443">http://dx.doi.org/10.1002/9783527648443</a>
<a href="http://site.ebrary.com/lib/alltitles/Doc?id=10575536">http://site.ebrary.com/lib/alltitles/Doc?id=10575536</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Instrumentation and metrology in oceanographyent://SD_ILS/0/SD_ILS:3053952026-01-19T03:30:38Z2026-01-19T03:30:38ZAuthor Le Menn, Marc.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ebrary <a href="http://oclc-marc.ebrary.com/Doc?id=10684971">An electronic book accessible through the World Wide Web; click to view</a>
<a href="http://lib.myilibrary.com?id=527787">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118561959">http://dx.doi.org/10.1002/9781118561959</a>
Table of contents <a href="http://catdir.loc.gov/catdir/enhancements/fy1303/2012025490-t.html">http://catdir.loc.gov/catdir/enhancements/fy1303/2012025490-t.html</a>
ebrary <a href="http://site.ebrary.com/id/10684971">http://site.ebrary.com/id/10684971</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Graphene Nanoelectronics Metrology, Synthesis, Properties and Applicationsent://SD_ILS/0/SD_ILS:1952032026-01-19T03:30:38Z2026-01-19T03:30:38ZAuthor Raza, Hassan. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-22984-8">http://dx.doi.org/10.1007/978-3-642-22984-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>A practical guide to optical metrology for thin filmsent://SD_ILS/0/SD_ILS:3062622026-01-19T03:30:38Z2026-01-19T03:30:38ZAuthor Quinten, Michael.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.msvu.ca:2048/login?url=http://www.msvu.eblib.com/patron/FullRecord.aspx?p=1037093">Check for Full Text</a> Access restricted: MSVU users only
Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1037093">Click here to view book</a>
<a href="http://lib.myilibrary.com?id=478849">Connect to MyiLibrary resource.</a>
John Wiley <a href="http://dx.doi.org/10.1002/9783527664344">http://dx.doi.org/10.1002/9783527664344</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Measurements with persons theory, methods, and implementation areasent://SD_ILS/0/SD_ILS:2623132026-01-19T03:30:38Z2026-01-19T03:30:38ZAuthor Berglund, Birgitta.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://www.tandfebooks.com/isbn/9780203816660">Click here to view</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals of laser micromachiningent://SD_ILS/0/SD_ILS:5406252026-01-19T03:30:38Z2026-01-19T03:30:38ZAuthor Schaeffer, Ronald D., author.<br/>Preferred Shelf Number TA1675 .S33 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439860564">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>100 years of superconductivityent://SD_ILS/0/SD_ILS:5456112026-01-19T03:30:38Z2026-01-19T03:30:38ZAuthor Rogalla, H. (Horst) Kes, P. H. (Peter H.)<br/>Preferred Shelf Number QC611.96 .A16 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781439849484">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>Coordinate measuring machines and systemsent://SD_ILS/0/SD_ILS:5468122026-01-19T03:30:38Z2026-01-19T03:30:38ZAuthor Hocken, Robert J. Pereira, Paulo H.<br/>Preferred Shelf Number TA165.5 .C66 2012<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420017533">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>