Search Results for Metrology. - Narrowed by: Nanotechnology.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetrology.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026ps$003d300?dt=list
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Metrology
ent://SD_ILS/0/SD_ILS:485379
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Author Gao, Wei. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-10-4938-5">https://doi.org/10.1007/978-981-10-4938-5</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of Metrology and Applications
ent://SD_ILS/0/SD_ILS:528422
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Author Aswal, Dinesh K. editor. Yadav, Sanjay. editor. Takatsuji, Toshiyuki. editor. Rachakonda, Prem. editor. Kumar, Harish. editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-981-99-2074-7">https://doi.org/10.1007/978-981-99-2074-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications
ent://SD_ILS/0/SD_ILS:195203
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Author Raza, Hassan. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-22984-8">http://dx.doi.org/10.1007/978-3-642-22984-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Metrology and standardization of nanotechnology : protocols and industrial innovations
ent://SD_ILS/0/SD_ILS:424285
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Author Mansfield, Elisabeth, editor. Kaiser, Debra L., editor. Fujita, Daisuke, editor. Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1002/9783527800308">Wiley Online Library</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Luminescence : the instrumental key to the future of nanotechnology
ent://SD_ILS/0/SD_ILS:545621
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Author Gilmore, Adam M., editor.<br/>Preferred Shelf Number QC476.5 .L86 2013<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9789814267724">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:355774
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Author Leach, R. K.<br/>Preferred Shelf Number ONLINE(355774.1)<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a>
<a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Fundamental principles of engineering nanometrology
ent://SD_ILS/0/SD_ILS:145816
2026-01-18T16:46:44Z
2026-01-18T16:46:44Z
Author Leach, R. K.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>