Search Results for Metrology. - Narrowed by: Nanotechnology. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMetrology.$0026qf$003dSUBJECT$002509Subject$002509Nanotechnology.$002509Nanotechnology.$0026ic$003dtrue$0026ps$003d300? 2024-11-07T06:30:19Z Metrology ent://SD_ILS/0/SD_ILS:485379 2024-11-07T06:30:19Z 2024-11-07T06:30:19Z Author&#160;Gao, Wei. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-10-4938-5">https://doi.org/10.1007/978-981-10-4938-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Graphene Nanoelectronics Metrology, Synthesis, Properties and Applications ent://SD_ILS/0/SD_ILS:195203 2024-11-07T06:30:19Z 2024-11-07T06:30:19Z Author&#160;Raza, Hassan. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-22984-8">http://dx.doi.org/10.1007/978-3-642-22984-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Metrology and standardization of nanotechnology : protocols and industrial innovations ent://SD_ILS/0/SD_ILS:424285 2024-11-07T06:30:19Z 2024-11-07T06:30:19Z Author&#160;Mansfield, Elisabeth, editor.&#160;Kaiser, Debra L., editor.&#160;Fujita, Daisuke, editor.&#160;Voorde, M. H. van de (Marcel H.), editor.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1002/9783527800308">Wiley Online Library</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamental principles of engineering nanometrology ent://SD_ILS/0/SD_ILS:145816 2024-11-07T06:30:19Z 2024-11-07T06:30:19Z Author&#160;Leach, R. K.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Fundamental principles of engineering nanometrology ent://SD_ILS/0/SD_ILS:355774 2024-11-07T06:30:19Z 2024-11-07T06:30:19Z Author&#160;Leach, R. K.<br/>Preferred Shelf Number&#160;ONLINE(355774.1)<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9781455777532">http://www.sciencedirect.com/science/book/9781455777532</a> <a href="http://www.sciencedirect.com/science/book/9780080964546">http://www.sciencedirect.com/science/book/9780080964546</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>