Search Results for Microelectronics - Narrowed by: Condensed matter. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroelectronics$0026qf$003dSUBJECT$002509Subject$002509Condensed$002bmatter.$002509Condensed$002bmatter.$0026ic$003dtrue$0026ps$003d300?dt=list 2026-03-20T13:44:29Z Fundamentals of Bias Temperature Instability in MOS Transistors Characterization Methods, Process and Materials Impact, DC and AC Modeling ent://SD_ILS/0/SD_ILS:616582 2026-03-20T13:44:29Z 2026-03-20T13:44:29Z Author&#160;Mahapatra, Souvik. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-81-322-2508-9">https://doi.org/10.1007/978-81-322-2508-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> High Dielectric Constant Materials VLSI MOSFET Applications ent://SD_ILS/0/SD_ILS:180748 2026-03-20T13:44:29Z 2026-03-20T13:44:29Z Author&#160;Huff, H.R. editor.&#160;Gilmer, D.C. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/b137574">http://dx.doi.org/10.1007/b137574</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> System-level Test and Validation of Hardware/Software Systems ent://SD_ILS/0/SD_ILS:175272 2026-03-20T13:44:29Z 2026-03-20T13:44:29Z Author&#160;Sonza Reorda, Matteo. editor.&#160;Peng, Zebo. editor.&#160;Violante, Massimo. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/1-84628-145-8">http://dx.doi.org/10.1007/1-84628-145-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Low-Power CMOS Digital Pixel Imagers for High-Speed Uncooled PbSe IR Applications ent://SD_ILS/0/SD_ILS:611123 2026-03-20T13:44:29Z 2026-03-20T13:44:29Z Author&#160;Margarit, Josep Maria. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-3-319-49962-8">https://doi.org/10.1007/978-3-319-49962-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Elements of Plasma Technology ent://SD_ILS/0/SD_ILS:614772 2026-03-20T13:44:29Z 2026-03-20T13:44:29Z Author&#160;Wong, Chiow San. author.&#160;Mongkolnavin, Rattachat. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-981-10-0117-8">https://doi.org/10.1007/978-981-10-0117-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Copper Electrodeposition for Nanofabrication of Electronics Devices ent://SD_ILS/0/SD_ILS:530918 2026-03-20T13:44:29Z 2026-03-20T13:44:29Z Author&#160;Kondo, Kazuo. editor.&#160;Akolkar, Rohan N. editor.&#160;Barkey, Dale P. editor.&#160;Yokoi, Masayuki. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="https://doi.org/10.1007/978-1-4614-9176-7">https://doi.org/10.1007/978-1-4614-9176-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Lattice engineering : technology and applications ent://SD_ILS/0/SD_ILS:546664 2026-03-20T13:44:29Z 2026-03-20T13:44:29Z Author&#160;Wang, Shumin.<br/>Preferred Shelf Number&#160;TA403 .L38 2013<br/>Electronic Access&#160;<a href="https://www.taylorfrancis.com/books/9789814364256">Click here to view.</a><br/>Format:&#160;Books<br/>Availability&#160;Online Library~1<br/>