Search Results for Microelectronics -- Measurement.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroelectronics$002b--$002bMeasurement.$0026ps$003d300?dt=list2024-12-18T14:50:15ZDigital holography for MEMS and microsystem metrologyent://SD_ILS/0/SD_ILS:3057322024-12-18T14:50:15Z2024-12-18T14:50:15ZAuthor Asundi, Anand.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access John Wiley <a href="http://dx.doi.org/10.1002/9781119997290">http://dx.doi.org/10.1002/9781119997290</a>
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<a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Electronic systems maintenance handbookent://SD_ILS/0/SD_ILS:2867292024-12-18T14:50:15Z2024-12-18T14:50:15ZAuthor Whitaker, Jerry C.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420036855">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>