Search Results for Microelectronics -- Reliability. - Narrowed by: Microelectronics.
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroelectronics$002b--$002bReliability.$0026qf$003dSUBJECT$002509Subject$002509Microelectronics.$002509Microelectronics.$0026ps$003d300?
2026-03-08T09:11:33Z
Reliability prediction for microelectronics
ent://SD_ILS/0/SD_ILS:598968
2026-03-08T09:11:33Z
2026-03-08T09:11:33Z
Author Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.<br/>Preferred Shelf Number TK7874<br/>Electronic Access <a href="https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961">https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design for Manufacturability From 1D to 4D for 90–22 nm Technology Nodes
ent://SD_ILS/0/SD_ILS:488642
2026-03-08T09:11:33Z
2026-03-08T09:11:33Z
Author Balasinski, Artur. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="https://doi.org/10.1007/978-1-4614-1761-3">https://doi.org/10.1007/978-1-4614-1761-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>