Search Results for Microelectronics. - Narrowed by: 2009
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroelectronics.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092009$0025092009$0026ps$003d300?
2025-12-14T11:51:31Z
Materials science in microelectronics
ent://SD_ILS/0/SD_ILS:256402
2025-12-14T11:51:31Z
2025-12-14T11:51:31Z
Author Machlin, E. S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446394">http://www.sciencedirect.com/science/book/9780080446394</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446400">http://www.sciencedirect.com/science/book/9780080446400</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Networks-on-Chips : Theory and Practice
ent://SD_ILS/0/SD_ILS:544435
2025-12-14T11:51:31Z
2025-12-14T11:51:31Z
Author El-Kharashi, Mohamed Watheq, editor. Elmiligi, Haytham, editor. Gebali, Fayez, editor. Taylor and Francis.<br/>Preferred Shelf Number TK5105.546<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9780429294853">Click here to view.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advanced signal integrity for high-speed digital designs
ent://SD_ILS/0/SD_ILS:249561
2025-12-14T11:51:31Z
2025-12-14T11:51:31Z
Author Hall, Stephen H. Heck, Howard L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electrostatic discharge understand, simulate and fix ESD problems
ent://SD_ILS/0/SD_ILS:249573
2025-12-14T11:51:31Z
2025-12-14T11:51:31Z
Author Mardiguian, Michel.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability wearout mechanisms in advanced CMOS technologies
ent://SD_ILS/0/SD_ILS:249574
2025-12-14T11:51:31Z
2025-12-14T11:51:31Z
Author Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design of cost-efficient interconnect processing units : Spidergon STNoC
ent://SD_ILS/0/SD_ILS:539486
2025-12-14T11:51:31Z
2025-12-14T11:51:31Z
Author Coppola, Marcello.<br/>Preferred Shelf Number TK5105.546 .D47 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420044720">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>
Defects in microelectronic materials and devices
ent://SD_ILS/0/SD_ILS:543196
2025-12-14T11:51:31Z
2025-12-14T11:51:31Z
Author Fleetwood, D. M. (Dan M.) Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Preferred Shelf Number TK7871 .D44 2009<br/>Electronic Access <a href="https://www.taylorfrancis.com/books/9781420043778">Click here to view.</a><br/>Format: Books<br/>Availability Online Library~1<br/>