Search Results for Microelectronics. - Narrowed by: 2009 SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroelectronics.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092009$0025092009$0026ps$003d300$0026isd$003dtrue? 2024-11-15T19:20:14Z Materials science in microelectronics ent://SD_ILS/0/SD_ILS:256402 2024-11-15T19:20:14Z 2024-11-15T19:20:14Z Author&#160;Machlin, E. S.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446394">http://www.sciencedirect.com/science/book/9780080446394</a> ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446400">http://www.sciencedirect.com/science/book/9780080446400</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Advanced signal integrity for high-speed digital designs ent://SD_ILS/0/SD_ILS:249561 2024-11-15T19:20:14Z 2024-11-15T19:20:14Z Author&#160;Hall, Stephen H.&#160;Heck, Howard L.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Electrostatic discharge understand, simulate and fix ESD problems ent://SD_ILS/0/SD_ILS:249573 2024-11-15T19:20:14Z 2024-11-15T19:20:14Z Author&#160;Mardiguian, Michel.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Reliability wearout mechanisms in advanced CMOS technologies ent://SD_ILS/0/SD_ILS:249574 2024-11-15T19:20:14Z 2024-11-15T19:20:14Z Author&#160;Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Design of cost-efficient interconnect processing units Spidergon STNoC ent://SD_ILS/0/SD_ILS:287752 2024-11-15T19:20:14Z 2024-11-15T19:20:14Z Author&#160;Coppola, Marcello.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420044720">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Defects in microelectronic materials and devices ent://SD_ILS/0/SD_ILS:286010 2024-11-15T19:20:14Z 2024-11-15T19:20:14Z Author&#160;Fleetwood, Daniel.&#160;Pantelides, Sokrates T.&#160;Schrimpf, Ronald Donald.<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>