Search Results for Microelectronics. - Narrowed by: 2009
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https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroelectronics.$0026qf$003dPUBDATE$002509Publication$002bDate$0025092009$0025092009$0026ps$003d300$0026isd$003dtrue?
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Materials science in microelectronics
ent://SD_ILS/0/SD_ILS:256402
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Author Machlin, E. S.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446394">http://www.sciencedirect.com/science/book/9780080446394</a>
ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780080446400">http://www.sciencedirect.com/science/book/9780080446400</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Advanced signal integrity for high-speed digital designs
ent://SD_ILS/0/SD_ILS:249561
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Author Hall, Stephen H. Heck, Howard L.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Electrostatic discharge understand, simulate and fix ESD problems
ent://SD_ILS/0/SD_ILS:249573
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Author Mardiguian, Michel.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Reliability wearout mechanisms in advanced CMOS technologies
ent://SD_ILS/0/SD_ILS:249574
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Author Strong, Alvin Wayne, 1946-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access IEEE Xplore <a href="http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029">http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Design of cost-efficient interconnect processing units Spidergon STNoC
ent://SD_ILS/0/SD_ILS:287752
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Author Coppola, Marcello.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420044720">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Defects in microelectronic materials and devices
ent://SD_ILS/0/SD_ILS:286010
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Author Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420043778">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>