Search Results for Microengineering. - Narrowed by: Spectroscopy and Microscopy.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroengineering.$0026qf$003dSUBJECT$002509Subject$002509Spectroscopy$002band$002bMicroscopy.$002509Spectroscopy$002band$002bMicroscopy.$0026ic$003dtrue$0026ps$003d300$0026isd$003dtrue?dt=list2024-11-20T10:37:44ZNew Trends in Atomic and Molecular Physics Advanced Technological Applicationsent://SD_ILS/0/SD_ILS:3345482024-11-20T10:37:44Z2024-11-20T10:37:44ZAuthor Mohan, Man. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334548.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-38167-6">http://dx.doi.org/10.1007/978-3-642-38167-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraineent://SD_ILS/0/SD_ILS:3323212024-11-20T10:37:44Z2024-11-20T10:37:44ZAuthor Fesenko, Olena. editor. Yatsenko, Leonid. editor. Brodin, Mikhaylo. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332321.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-7675-7">http://dx.doi.org/10.1007/978-1-4614-7675-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonanceent://SD_ILS/0/SD_ILS:3327762024-11-20T10:37:44Z2024-11-20T10:37:44ZAuthor van Schooten, Kipp. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(332776.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-319-00590-4">http://dx.doi.org/10.1007/978-3-319-00590-4</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>