Search Results for Microscopy, Electron, Transmission.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroscopy$00252C$002bElectron$00252C$002bTransmission.$0026ps$003d300?2024-11-02T03:36:16ZBasic techniques for transmission electron microscopyent://SD_ILS/0/SD_ILS:2512162024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Hayat, M. A., 1936-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access ScienceDirect <a href="http://www.sciencedirect.com/science/book/9780123339263">http://www.sciencedirect.com/science/book/9780123339263</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transmission electron microscopy in micro-nanoelectronicsent://SD_ILS/0/SD_ILS:3054232024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Claverie, A. (Alain)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1117321</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781118579022">http://dx.doi.org/10.1002/9781118579022</a>
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Volltext <a href="http://proquest.tech.safaribooksonline.de/9781118579053">http://proquest.tech.safaribooksonline.de/9781118579053</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Aberration-corrected analytical transmission electron microscopyent://SD_ILS/0/SD_ILS:3189712024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Brydson, Rik, editor, author.<br/>Preferred Shelf Number ONLINE(318971.1)<br/>Electronic Access <a href="http://lib.myilibrary.com?id=320457">Connect to MyiLibrary resource.</a>
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John Wiley <a href="http://dx.doi.org/10.1002/9781119978848">http://dx.doi.org/10.1002/9781119978848</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Aberration-corrected analytical transmission electron microscopyent://SD_ILS/0/SD_ILS:3041382024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Brydson, Rik.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access Ebook Library <a href="http://public.eblib.com/EBLPublic/PublicView.do?ptiID=693217">http://public.eblib.com/EBLPublic/PublicView.do?ptiID=693217</a>
John Wiley <a href="http://dx.doi.org/10.1002/9781119978848">http://dx.doi.org/10.1002/9781119978848</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Introduction to Conventional Transmission Electron Microscopyent://SD_ILS/0/SD_ILS:2356522024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor De Graef, Marc.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1017/CBO9780511615092">Access by subscription</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Fundamentals of transmission electron microscopyent://SD_ILS/0/SD_ILS:190832024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Heidenreich, Robert D.<br/>Preferred Shelf Number QC 373.E4 H3627 1964<br/>Format: Books<br/>Availability Beytepe Library~1<br/>Transmission Electron Microscopy and Diffractometry of Materialsent://SD_ILS/0/SD_ILS:3332652024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333265.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-29761-8">http://dx.doi.org/10.1007/978-3-642-29761-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Scanning Transmission Electron Microscopy Imaging and Analysisent://SD_ILS/0/SD_ILS:1728022024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Pennycook, Stephen J. editor. Nellist, Peter D. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transmission Electron Microscopy Physics of Image Formationent://SD_ILS/0/SD_ILS:1660762024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Kohl, Helmut. author. Reimer, Ludwig. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-40093-8">http://dx.doi.org/10.1007/978-0-387-40093-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transmission Electron Microscopy and Diffractometry of Materialsent://SD_ILS/0/SD_ILS:1869972024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Biological specimen preparation for transmission electron microscopyent://SD_ILS/0/SD_ILS:563302024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Glauert, Audrey M. Lewis, Peter R., ort. yaz.<br/>Preferred Shelf Number QH 212.E4 G552 2000<br/>Format: Books<br/>Availability Health Sciences Library~1<br/>In Situ Transmission Electron Microscopy Studies of Carbon Nanotube Nucleation Mechanism and Carbon Nanotube-Clamped Metal Atomic Chainsent://SD_ILS/0/SD_ILS:3343952024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Tang, Dai-Ming. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334395.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-37259-9">http://dx.doi.org/10.1007/978-3-642-37259-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Sample Preparation Handbook for Transmission Electron Microscopy Techniquesent://SD_ILS/0/SD_ILS:1724752024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5975-1">http://dx.doi.org/10.1007/978-1-4419-5975-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Sample Preparation Handbook for Transmission Electron Microscopy Methodologyent://SD_ILS/0/SD_ILS:1680962024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-98182-6">http://dx.doi.org/10.1007/978-0-387-98182-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transmission Electron Microscopy A Textbook for Materials Scienceent://SD_ILS/0/SD_ILS:1673512024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Williams, David B. author. Carter, C. Barry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-76501-3">http://dx.doi.org/10.1007/978-0-387-76501-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Microstructure of metals and alloys an atlas of transmission electron microscopy imagesent://SD_ILS/0/SD_ILS:2887592024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Zlateva, Ganka. Martinova, Zlatanka.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420075571">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Characterization of radiation-damage by transmission electron microscopyent://SD_ILS/0/SD_ILS:2753952024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Jenkins, M. L., 1949- Kirk, M. A., 1942-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420034646">Distributed by publisher. 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H. di.<br/>Preferred Shelf Number QS 517 E71 2013<br/>Format: Books<br/>Availability Health Sciences Library~1<br/>Fullerene nano-whiskersent://SD_ILS/0/SD_ILS:2909002024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Miyazawa, Kun'ichi.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9789814267632">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Advances in carbon nanomaterials science and applicationsent://SD_ILS/0/SD_ILS:2909072024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Tagmatarchis, Nikos.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9789814267885">Distributed by publisher. 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Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of charged particle opticsent://SD_ILS/0/SD_ILS:2896302024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Orloff, Jon.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420045550">Distributed by publisher. Purchase or institutional license may be required for access.</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Handbook of surface and interface analysis methods for problem-solvingent://SD_ILS/0/SD_ILS:2847332024-11-02T03:36:16Z2024-11-02T03:36:16ZAuthor Rivir̈e, J. C. Myhra, S. (Sverre), 1943-<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://marc.crcnetbase.com/isbn/9781420007800">Distributed by publisher. 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