Search Results for Microscopy, Electron - Narrowed by: Chemistry.SirsiDynix Enterprisehttps://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroscopy$00252C$002bElectron$0026qf$003dSUBJECT$002509Subject$002509Chemistry.$002509Chemistry.$0026ps$003d300$0026isd$003dtrue?2024-11-06T18:34:34ZModeling Nanoscale Imaging in Electron Microscopyent://SD_ILS/0/SD_ILS:1741182024-11-06T18:34:34Z2024-11-06T18:34:34ZAuthor Vogt, Thomas. editor. Dahmen, Wolfgang. editor. Binev, Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-2191-7">http://dx.doi.org/10.1007/978-1-4614-2191-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Transmission Electron Microscopy and Diffractometry of Materialsent://SD_ILS/0/SD_ILS:1869972024-11-06T18:34:34Z2024-11-06T18:34:34ZAuthor Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEMent://SD_ILS/0/SD_ILS:1652202024-11-06T18:34:34Z2024-11-06T18:34:34ZAuthor Egerton, Ray F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>