Search Results for Microscopy, Electron. - Narrowed by: Surfaces (Physics).
SirsiDynix Enterprise
https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroscopy$00252C$002bElectron.$0026qf$003dSUBJECT$002509Subject$002509Surfaces$002b$002528Physics$002529.$002509Surfaces$002b$002528Physics$002529.$0026pe$003dd$00253A$0026ps$003d300?dt=list
2024-12-30T19:33:57Z
Modeling Nanoscale Imaging in Electron Microscopy
ent://SD_ILS/0/SD_ILS:174118
2024-12-30T19:33:57Z
2024-12-30T19:33:57Z
Author Vogt, Thomas. editor. Dahmen, Wolfgang. editor. Binev, Peter. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4614-2191-7">http://dx.doi.org/10.1007/978-1-4614-2191-7</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transmission Electron Microscopy and Diffractometry of Materials
ent://SD_ILS/0/SD_ILS:333265
2024-12-30T19:33:57Z
2024-12-30T19:33:57Z
Author Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(333265.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-29761-8">http://dx.doi.org/10.1007/978-3-642-29761-8</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Scanning Transmission Electron Microscopy Imaging and Analysis
ent://SD_ILS/0/SD_ILS:172802
2024-12-30T19:33:57Z
2024-12-30T19:33:57Z
Author Pennycook, Stephen J. editor. Nellist, Peter D. editor. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-7200-2">http://dx.doi.org/10.1007/978-1-4419-7200-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
New Horizons of Applied Scanning Electron Microscopy
ent://SD_ILS/0/SD_ILS:190537
2024-12-30T19:33:57Z
2024-12-30T19:33:57Z
Author Shimizu, Kenichi. author. Mitani, Tomoaki. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-03160-1">http://dx.doi.org/10.1007/978-3-642-03160-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transmission Electron Microscopy and Diffractometry of Materials
ent://SD_ILS/0/SD_ILS:186997
2024-12-30T19:33:57Z
2024-12-30T19:33:57Z
Author Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-540-73886-2">http://dx.doi.org/10.1007/978-3-540-73886-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
In Situ Transmission Electron Microscopy Studies of Carbon Nanotube Nucleation Mechanism and Carbon Nanotube-Clamped Metal Atomic Chains
ent://SD_ILS/0/SD_ILS:334395
2024-12-30T19:33:57Z
2024-12-30T19:33:57Z
Author Tang, Dai-Ming. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE(334395.1)<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-3-642-37259-9">http://dx.doi.org/10.1007/978-3-642-37259-9</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Sample Preparation Handbook for Transmission Electron Microscopy Methodology
ent://SD_ILS/0/SD_ILS:168096
2024-12-30T19:33:57Z
2024-12-30T19:33:57Z
Author Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-98182-6">http://dx.doi.org/10.1007/978-0-387-98182-6</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Sample Preparation Handbook for Transmission Electron Microscopy Techniques
ent://SD_ILS/0/SD_ILS:172475
2024-12-30T19:33:57Z
2024-12-30T19:33:57Z
Author Ayache, Jeanne. author. Beaunier, Luc. author. Boumendil, Jacqueline. author. Ehret, Gabrielle. author. Laub, Danièle. author.<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-1-4419-5975-1">http://dx.doi.org/10.1007/978-1-4419-5975-1</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis
ent://SD_ILS/0/SD_ILS:167790
2024-12-30T19:33:57Z
2024-12-30T19:33:57Z
Author Echlin, Patrick. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-85731-2">http://dx.doi.org/10.1007/978-0-387-85731-2</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Transmission Electron Microscopy A Textbook for Materials Science
ent://SD_ILS/0/SD_ILS:167351
2024-12-30T19:33:57Z
2024-12-30T19:33:57Z
Author Williams, David B. author. Carter, C. Barry. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/978-0-387-76501-3">http://dx.doi.org/10.1007/978-0-387-76501-3</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>
Physical Principles of Electron Microscopy An Introduction to TEM, SEM, and AEM
ent://SD_ILS/0/SD_ILS:165220
2024-12-30T19:33:57Z
2024-12-30T19:33:57Z
Author Egerton, Ray F. author. SpringerLink (Online service)<br/>Preferred Shelf Number ONLINE<br/>Electronic Access <a href="http://dx.doi.org/10.1007/b136495">http://dx.doi.org/10.1007/b136495</a><br/>Format: Electronic Resources<br/>Availability Online Library~1<br/>