Search Results for Microscopy - Narrowed by: Engineering. SirsiDynix Enterprise https://katalog.hacettepe.edu.tr/client/en_US/default/default/qu$003dMicroscopy$0026qf$003dSUBJECT$002509Subject$002509Engineering.$002509Engineering.$0026te$003dILS$0026ps$003d300$0026isd$003dtrue?dt=list 2024-12-25T16:16:15Z Confocal Raman Microscopy ent://SD_ILS/0/SD_ILS:192021 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;Dieing, Thomas. editor.&#160;Hollricher, Olaf. editor.&#160;Toporski, Jan. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-12522-5">http://dx.doi.org/10.1007/978-3-642-12522-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Acoustic Scanning Probe Microscopy ent://SD_ILS/0/SD_ILS:333153 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;Marinello, Francesco. editor.&#160;Passeri, Daniele. editor.&#160;Savio, Enrico. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333153.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-27494-7">http://dx.doi.org/10.1007/978-3-642-27494-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Noncontact Atomic Force Microscopy Volume 2 ent://SD_ILS/0/SD_ILS:190017 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;Morita, Seizo. editor.&#160;Giessibl, Franz J. editor.&#160;Wiesendanger, Roland. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-01495-6">http://dx.doi.org/10.1007/978-3-642-01495-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> New Horizons of Applied Scanning Electron Microscopy ent://SD_ILS/0/SD_ILS:190537 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;Shimizu, Kenichi. author.&#160;Mitani, Tomoaki. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-03160-1">http://dx.doi.org/10.1007/978-3-642-03160-1</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy in Nanoscience and Nanotechnology ent://SD_ILS/0/SD_ILS:190654 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;Bhushan, Bharat. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-03535-7">http://dx.doi.org/10.1007/978-3-642-03535-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy in Nanoscience and Nanotechnology 3 ent://SD_ILS/0/SD_ILS:333137 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;Bhushan, Bharat. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333137.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-25414-7">http://dx.doi.org/10.1007/978-3-642-25414-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Kelvin Probe Force Microscopy Measuring and Compensating Electrostatic Forces ent://SD_ILS/0/SD_ILS:195066 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;Sadewasser, Sascha. editor.&#160;Glatzel, Thilo. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-22566-6">http://dx.doi.org/10.1007/978-3-642-22566-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Atomic Force Microscopy Based Nanorobotics Modelling, Simulation, Setup Building and Experiments ent://SD_ILS/0/SD_ILS:194334 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;Xie, Hui. author.&#160;Onal, Cagdas. author.&#160;R&eacute;gnier, St&eacute;phane. author.&#160;Sitti, Metin. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-20329-9">http://dx.doi.org/10.1007/978-3-642-20329-9</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Scanning Probe Microscopy in Nanoscience and Nanotechnology 2 ent://SD_ILS/0/SD_ILS:191386 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;Bhushan, Bharat. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-10497-8">http://dx.doi.org/10.1007/978-3-642-10497-8</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Encyclopedia of Biophysics ent://SD_ILS/0/SD_ILS:333072 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;Roberts, Gordon C. K. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(333072.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-16712-6">http://dx.doi.org/10.1007/978-3-642-16712-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> High Permittivity Gate Dielectric Materials ent://SD_ILS/0/SD_ILS:334228 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;Kar, Samares. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(334228.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-36535-5">http://dx.doi.org/10.1007/978-3-642-36535-5</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Nanomaterials Imaging Techniques, Surface Studies, and Applications Selected Proceedings of the FP7 International Summer School Nanotechnology: From Fundamental Research to Innovations, August 26-September 2, 2012, Bukovel, Ukraine ent://SD_ILS/0/SD_ILS:332321 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;Fesenko, Olena. editor.&#160;Yatsenko, Leonid. editor.&#160;Brodin, Mikhaylo. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332321.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-1-4614-7675-7">http://dx.doi.org/10.1007/978-1-4614-7675-7</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance ent://SD_ILS/0/SD_ILS:332776 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;van Schooten, Kipp. author.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(332776.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-319-00590-4">http://dx.doi.org/10.1007/978-3-319-00590-4</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/> New Trends in Atomic and Molecular Physics Advanced Technological Applications ent://SD_ILS/0/SD_ILS:334548 2024-12-25T16:16:15Z 2024-12-25T16:16:15Z Author&#160;Mohan, Man. editor.&#160;SpringerLink (Online service)<br/>Preferred Shelf Number&#160;ONLINE(334548.1)<br/>Electronic Access&#160;<a href="http://dx.doi.org/10.1007/978-3-642-38167-6">http://dx.doi.org/10.1007/978-3-642-38167-6</a><br/>Format:&#160;Electronic Resources<br/>Availability&#160;Online Library~1<br/>